Distributed grating sensors using low-coherence reflectometry

被引：44
|
作者：
Volanthen, M
Geiger, H
Dakin, JP
机构：
[1] St. Johns College, Cambridge University, Cambridge
[2] Optoelectronics Research Centre, Southampton University
[3] Deutsche Telekom, Honeywell, MN
来源：
JOURNAL OF LIGHTWAVE TECHNOLOGY | 1997年 / 15卷 / 11期
关键词：
gratings; optical fibers; optical interferometry; sensors;
D O I：
10.1109/50.641525
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
Distributed grating sensors have recently been interrogated with low-coherence reflectometry. Initial results have been enhanced using two new and versatile configurations, The first system tracks the wavelength using a closed-loop scheme, while the second system scans the distance using an open-loop approach. Arbitrary strain and temperature profiles along gratings have been examined with 300 mu m spatial resolution and 5.4 mu epsilon root Hz accuracy, A theoretical model of the interrogation technique is derived and the predicted performance limits are examined experimentally.
引用
收藏
页码：2076 / 2082
页数：7
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