Measurements of Extremely Small Inductance Values

被引：0
|
作者：
Obrecht, Michael S. [1 ]
机构：
[1] Siborg Syst Inc, Waterloo, ON, Canada
来源：
2022 IEEE AUTOTESTCON | 2022年
关键词：
Inductance; measurement; offset; low frequency;
D O I：
10.1109/AUTOTESTCON47462.2022.9984782
中图分类号：
TB3 [工程材料学];
学科分类号：
0805 ; 080502 ;
摘要：
Measurement of small inductors is the trickiest compared to other component testing using typical LCR-meters providing test frequency of 100 kHz or lower. Inductance of 1 nH at 100 kHz only produces 6 mOhm impedance that is comparable to a contact resistance of the probes. Even at 1 MHz the impedance would only be 60 mOhms. We demonstrate a simple method of extraction of the two-wire probe parasitic inductance using HP4284A LCR-meter and HP16034E test fixture. The method effectively allows to measure sub nH inductors.
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页数：4
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