Raman spectra of thin solid films of some metal sulfides

被引：278

作者：

MincevaSukarova, B ^{[1
]}

Najdoski, M ^{[1
]}

Grozdanov, I ^{[1
]}

Chunnilall, CJ ^{[1
]}

机构：

[1] NATL PHYS LAB, TEDDINGTON TW11 0LW, MIDDX, ENGLAND

来源：

JOURNAL OF MOLECULAR STRUCTURE | 1997年 / 410卷

关键词：

Raman spectra; thin layers; semiconductors; metal sulfides/selenides;

D O I：

10.1016/S0022-2860(96)09713-X

中图分类号：

O64 [物理化学（理论化学）、化学物理学];

学科分类号：

070304 ; 081704 ;

摘要：

Thin solid films of metal sulfides: Cu2S, CuS, PbS, Sb2-xBixS3, Ag2S and HgS, and two selenides, Cu2Se and PbSe, were prepared by the technique of electroless chemical deposition. For the purpose of recording the Raman spectra, the metal sulfides (selenides) were deposited on glass substrates. All deposited thin films, as well as bulk samples, were characterized by the X-ray diffraction technique. The recorded Raman spectra were compared with the corresponding spectra of bulk metal sulfides (selenides) and discussed in terms of available structural data. (C) 1997 Elsevier Science B.V.

引用

页码：267 / 270

页数：4

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