Characterization of the transient thermal-lens effect using top-hat beam Z-scan

被引：10

作者：

Yang, Junyi ^{[1
]}

Wang, Yuxiao ^{[2
]}

Zhang, Xueru ^{[2
]}

Li, Changwei ^{[2
]}

Jin, Xiao ^{[2
]}

Shui, Min ^{[2
]}

Song, Yinglin ^{[1
]}

机构：

[1] Soochow Univ, Sch Phys Sci & Technol, Suzhou 215006, Peoples R China

[2] Harbin Inst Technol, Dept Phys, Harbin 15001, Peoples R China

来源：

JOURNAL OF PHYSICS B-ATOMIC MOLECULAR AND OPTICAL PHYSICS | 2009年 / 42卷 / 22期

关键词：

OPTICAL NONLINEARITIES; REFRACTION; REGIME; TRANSITION; 3RD-ORDER;

D O I：

10.1088/0953-4075/42/22/225404

中图分类号：

O43 [光学];

学科分类号：

070207 ; 0803 ;

摘要：

The transient thermal-lens effect in a solution is investigated by using the top-hat beam Z-scan technique. The numerical results show that the sensitivity of the top-hat beam Z-scan measurements is about 3.5 times greater than the Gaussian beams for the transient thermal-lens effect when the phase shift is small, which is greater than that for the Kerr effect and the steady-state thermal-lens effect. The reasons are also discussed in detail.

引用

页数：5

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