Characterization of the transient thermal-lens effect using top-hat beam Z-scan

被引：10
|
作者：
Yang, Junyi [1 ]
Wang, Yuxiao [2 ]
Zhang, Xueru [2 ]
Li, Changwei [2 ]
Jin, Xiao [2 ]
Shui, Min [2 ]
Song, Yinglin [1 ]
机构：
[1] Soochow Univ, Sch Phys Sci & Technol, Suzhou 215006, Peoples R China
[2] Harbin Inst Technol, Dept Phys, Harbin 15001, Peoples R China
来源：
JOURNAL OF PHYSICS B-ATOMIC MOLECULAR AND OPTICAL PHYSICS | 2009年 / 42卷 / 22期
关键词：
OPTICAL NONLINEARITIES; REFRACTION; REGIME; TRANSITION; 3RD-ORDER;
D O I：
10.1088/0953-4075/42/22/225404
中图分类号：
O43 [光学];
学科分类号：
070207 ; 0803 ;
摘要：
The transient thermal-lens effect in a solution is investigated by using the top-hat beam Z-scan technique. The numerical results show that the sensitivity of the top-hat beam Z-scan measurements is about 3.5 times greater than the Gaussian beams for the transient thermal-lens effect when the phase shift is small, which is greater than that for the Kerr effect and the steady-state thermal-lens effect. The reasons are also discussed in detail.
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页数：5
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