Wafer screening of the front-end ASICs for ATLAS SCT

被引：0

作者：

Lacasta, C ^{[1
]}

Kaplon, J ^{[1
]}

机构：

[1] Univ Valencia, Inst Fis Corpuscular, E-46100 Valencia, Spain

来源：

PROCEEDINGS OF THE FIFTH WORKSHOP ON ELECTRONICS FOR LHC EXPERIMENTS | 1999年

关键词：

D O I：

暂无

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

The continuous increase in volume of silicon trackers in the coming experiments poses a number of new issues to unravel. Among them, the high number of detector readout modules to be built in a relatively quick time will require the use of preselected ASICs. In the particular case of the ATLAS SCT, where about 6 million channels have to be read out with little chance for replacement of the electronics, that becomes a considerable challenge. Specific architecture features of the front-end chips will call for very specific and dedicated electronic testers to provide a full and efficient characterization. This paper describes the system built for the preselection and characterization of the ABCD front-end chip to be used in the readout of the ATLAS SCT microstrip silicon sensors. The system has been used successfully during the last year to tag the 6000 ABCD chips that have been built up to now and has been upgraded to cope with the new features of the last version of the chip.

引用

页码：133 / 137

页数：5

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