New qualification approaches for opto-electronic devices

被引：2

作者：

Berthier, P ^{[1
]}

Laffitte, D ^{[1
]}

Périnet, J ^{[1
]}

Goudard, JL ^{[1
]}

Boddaert, X ^{[1
]}

Chazan, P ^{[1
]}

机构：

[1] Alcatel Optron France, F-91625 Nozay, France

来源：

52ND ELECTRONIC COMPONENTS & TECHNOLOGY CONFERENCE, 2002 PROCEEDINGS | 2002年

关键词：

D O I：

10.1109/ECTC.2002.1008149

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

Qualification of opto-electronic devices is a mandatory but complex activity to perform in a fast changing technical environment and under a strong market pressure. In this paper, we analyze the advantages and drawbacks of the traditional qualification approach based on both end-development tests defined by international standards and statistical reliability calculations. We explain how we are adapting our qualification practices towards risk assessment methods and design for reliability process. Looking at the future trends for telecom opto-electronic devices, possible challenges that qualification activity will have to face are finally discussed.

引用

页码：551 / 557

页数：3

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