Novel method for unambiguous ion identification in mixed ion beams extracted from an electron beam ion trap

被引：9
|
作者：
Meissl, W.
Simon, M. C.
Lopez-Urrutia, J. R. Crespo
Tawara, H.
Ullrich, J.
Winter, H. P.
Aumayr, F.
机构：
[1] Vienna Univ Technol, Inst Allgemeine Phys, A-1040 Vienna, Austria
[2] Max Planck Inst Kernphys, EBIT Grp, D-69029 Heidelberg, Germany
来源：
REVIEW OF SCIENTIFIC INSTRUMENTS | 2006年 / 77卷 / 09期
基金：
奥地利科学基金会;
关键词：
D O I：
10.1063/1.2238856
中图分类号：
TH7 [仪器、仪表];
学科分类号：
0804 ; 080401 ; 081102 ;
摘要：
A novel technique to identify small fluxes of mixed highly charged ion beams extracted from an electron beam ion trap is presented and practically demonstrated. The method exploits projectile charge state dependent potential emission of electrons as induced by ion impact on a metal surface to separate ions with identical or very similar mass-to-charge ratio. (c) 2006 American Institute of Physics.
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页数：4
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