Testing of Automated Systems

被引：0
|
作者：
Mondello, Marina [1 ]
Dhawan, Anil [1 ]
Keller, Erich [2 ]
机构：
[1] ComEd, Oak Brook Terrace, IL USA
[2] G&W Elect Co, Bolingbrook, IL USA
来源：
2014 IEEE PES T&D CONFERENCE AND EXPOSITION | 2014年
关键词：
Automatic Testing; Design for Testability; Smart Grids; System Testing;
D O I：
暂无
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
The paper develops guidelines and best practices for designing and testing systems of IEDs protecting and controlling power system apparatus. The paper draws upon experiences in developing a next-generation automated loop scheme system including non-communicating reclosers and controls. The system was developed in cooperation between ComEd and G&W using Viper-ST reclosers with SEL-651R controls.
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收藏
页数：4
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