Radiation tolerance of an SLVS receiver based on commercial components

被引：0
|
作者：
Belloni, A. [1 ]
Grassi, T. [1 ]
Nogima, H. [2 ]
Vaz, M. [3 ]
机构：
[1] Univ MD, Dept Phys, College Pk, MD 20742 USA
[2] Univ Estado Rio De Janeiro, Inst Fis, BR-20550013 Rio De Janeiro, RJ, Brazil
[3] CBPF, BR-22290180 Rio De Janeiro, RJ, Brazil
来源：
JOURNAL OF INSTRUMENTATION | 2014年 / 9卷
关键词：
Radiation damage to electronic components; Front-end electronics for detector readout; Digital electronic circuits;
D O I：
10.1088/1748-0221/9/03/P03008
中图分类号：
TH7 [仪器、仪表];
学科分类号：
0804 ; 080401 ; 081102 ;
摘要：
The capability of ProASIC3L FPGAs to receive SLVS signals has been studied in laboratory conditions and after irradiation. The irradiation has been performed using a Cs-137 source. The SLVS communication has remained functional after 201 Gy. The slowest rise time after irradiation is 324 ps, negligibly degraded with respect to the pre-irradiation rise time.
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页数：9
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