Optical Properties and Microstructure Rietveld Analysis of CeO2-doped SrTiO3 Thin Film

被引：3
|
作者：
Rahmawaty, V [1 ]
Sumaryada, T. [1 ]
Irzaman [1 ]
机构：
[1] Bogor Agr Univ, Dept Phys, Jalan Meranti Kampus IPB Dramaga, Bogor 16680, Indonesia
来源：
INTERNATIONAL CONFERENCE ON SCIENCE AND APPLIED SCIENCE (ICSAS) 2019 | 2019年 / 2202卷
关键词：
D O I：
10.1063/1.5141722
中图分类号：
O [数理科学和化学]; P [天文学、地球科学]; Q [生物科学]; N [自然科学总论];
学科分类号：
07 ; 0710 ; 09 ;
摘要：
Cerium Oxide (CeO2)-doped Strontium Titanate (SrTiO3) thin films have been synthesized using Chemical Solution Deposition (CSD method. The doping composition of CeO2 were set to 0%, 2%, 4%, 6% weight percent. Optical and structural characterization of the thin film was conducted by using the UV-Vis spectrophotometers, and the X -Ray Diffractometer. The results show that the thickness of the SrTiO3 film produced is 1,128 to 1,540 mu m, while the bandgap energy ranges from 3.28 eV to 3.45 eV. The lattice parameters produced are 3,909 angstrom to 3,951 angstrom so that the crystal structure forms a cube (alpha = beta = gamma = 90 degrees) with a crystallite size of 869.520 angstrom-915.632 angstrom. The Rietveld analysis of XRD data using MAUD Software confirms that the increasing value of CeO2 doping composition will reduce the lattice parameters of SrTiO3 thin film.
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页数：9
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