Development of Radiation Detectors Based on Semi-Insulating Silicon Carbide

被引:0
|
作者
Ruddy, Frank H. [1 ]
Seidel, John G. [1 ]
Flammang, Robert W. [1 ]
Singh, Ranbir [2 ]
Schroeder, John [2 ]
机构
[1] Westinghouse Elect Co, Sci & Technol Dept, 1332 Beulah Rd, Pittsburgh, PA 15235 USA
[2] GeneSiC Semicond Inc, Dulles, VA 20166 USA
来源
2008 IEEE NUCLEAR SCIENCE SYMPOSIUM AND MEDICAL IMAGING CONFERENCE (2008 NSS/MIC), VOLS 1-9 | 2009年
关键词
3D;
D O I
暂无
中图分类号
R8 [特种医学]; R445 [影像诊断学];
学科分类号
1002 ; 100207 ; 1009 ;
摘要
Fast-neutron detectors based on high-purity semi-insulating 4H silicon carbide (SiC) semiconductor have been fabricated and tested. The response characteristics of these detectors have been compared with those of epitaxial 4H-SiC Schottky diode detectors. The charge collection efficiency has been tested using alpha particles and the fast-neutron response has been tested with 14-MeV and 2.5-MeV neutrons. Over the applied voltage range tested, the charge collection efficiency for alpha particles is generally lower for the semi-insulating SiC detectors, and the fast-neutron detection efficiencies are also lower. Both the lower charge collection efficiency and the lower fast-neutron detection efficiencies are primarily caused by charge recombination in combination with the low electric fields across the thicker semi-insulating SiC detectors and the inability of the detector packaging to adequately withstand high voltages. Semi-insulating SiC detectors provide a viable alternative to epitaxial SiC diode detectors for fast-neutron detection and methods to improve the performance of semi-insulating SiC detectors are proposed.
引用
收藏
页码:5256 / +
页数:2
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