Nanoporous, low-dielectric constant organosilicate materials derived from inorganic polymer blends

被引:0
|
作者
Miller, RD
Volksen, W
Lee, VY
Connor, E
Magbitang, T
Zafran, R
Sundberg, L
Hawker, CJ
Hedrick, JL
Huang, E
Toney, M
Huang, QR
Frank, CW
Kim, HC
机构
[1] IBM Corp, Almaden Res Ctr, San Jose, CA 95120 USA
[2] IBM Corp, Thomas J Watson Res Ctr, Yorktown Hts, NY 10598 USA
[3] State Univ New Jersey, Dept Food Sci, New Brunswick, NJ 08901 USA
[4] Stanford Univ, Dept Chem Engn, Stanford, CA USA
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暂无
中图分类号
O6 [化学];
学科分类号
0703 ;
摘要
Porous materials will be needed to reach the ultralow-k dielectric on-chip insulator objectives for advanced semiconductor chips. Nanoporous organosilicates can be prepared using thermally labile macromolecular porogens and silsesquioxane resins. This process readily achieves dielectric constants of 1.5. There is a significant difference in porous morphologies depending on whether the porogens function by nucleation and growth or an actual templating mechanism.
引用
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页码:144 / 160
页数:17
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