Censoring;
Competing risks;
Complete-data likelihood;
Conditional expected values;
Control chart;
EM algorithm;
Masked data;
Missing;
Weibull distribution;
D O I:
10.1080/03610918.2018.1433845
中图分类号:
O21 [概率论与数理统计];
C8 [统计学];
学科分类号:
020208 ;
070103 ;
0714 ;
摘要:
In this paper, we propose a control chart to monitor the Weibull shape parameter where the observations are censored due to competing risks. We assume that the failure occurs due to two competing risks that are independent and follow Weibull distribution with different shape and scale parameters. The control charts are proposed to monitor one or both of the shape parameters of competing risk distributions and established based on the conditional expected values. The proposed control chart for both shape parameters is used in certain situations and allows to monitor both shape parameters in only one chart. The control limits depend on the sample size, number of failures due to each risk and the desired stable average run length (ARL). We also consider the estimation problem of the target parameters when the Phase I sample is incomplete. We assumed that some of the products that fail during the life testing have a cause of failure that is only known to belong to a certain subset of all possible failures. This case is known as masking. In the presence of masking, the expectation-maximization (EM) algorithm is proposed to estimate the parameters. For both cases, with and without masking, the behaviour of ARLs of charts is studied through the numerical methods. The influence of masking on the performance of proposed charts is also studied through a simulation study. An example illustrates the applicability of the proposed charts.
机构:
Washington State Univ, Dept Math & Stat, Pullman, WA 99164 USA
Washington State Univ, Sch Econ Sci, Pullman, WA 99164 USAWashington State Univ, Dept Math & Stat, Pullman, WA 99164 USA
Pascual, Francis G.
Navelski, Joseph P.
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h-index: 0
机构:
Washington State Univ, Sch Econ Sci, Pullman, WA 99164 USAWashington State Univ, Dept Math & Stat, Pullman, WA 99164 USA
机构:
McMaster Univ, Dept Math & Stat, Hamilton, ON L8S 4K1, CanadaMcMaster Univ, Dept Math & Stat, Hamilton, ON L8S 4K1, Canada
Balakrishnan, Narayanaswamy
So, Hon Yiu
论文数: 0引用数: 0
h-index: 0
机构:
McMaster Univ, Dept Math & Stat, Hamilton, ON L8S 4K1, CanadaMcMaster Univ, Dept Math & Stat, Hamilton, ON L8S 4K1, Canada
So, Hon Yiu
Ling, Man Ho
论文数: 0引用数: 0
h-index: 0
机构:
Hong Kong Inst Educ, Dept Math & Informat Technol, Hong Kong, Hong Kong, Peoples R ChinaMcMaster Univ, Dept Math & Stat, Hamilton, ON L8S 4K1, Canada
机构:
Qatar Univ, Coll Arts & Sci, Dept Math Stat & Phys, Stat Program, Doha 2713, QatarQatar Univ, Coll Arts & Sci, Dept Math Stat & Phys, Stat Program, Doha 2713, Qatar
Baklizi, Ayman
Abu Ghannam, Sawsan
论文数: 0引用数: 0
h-index: 0
机构:
Qatar Univ, Coll Arts & Sci, Dept Math Stat & Phys, Stat Program, Doha 2713, QatarQatar Univ, Coll Arts & Sci, Dept Math Stat & Phys, Stat Program, Doha 2713, Qatar
机构:
Coll. of Automation Engineering, Univ. of Electronic Science and Technology of China, Chengdu 610054, ChinaColl. of Automation Engineering, Univ. of Electronic Science and Technology of China, Chengdu 610054, China
Luo, Hang
Long, Bing
论文数: 0引用数: 0
h-index: 0
机构:
Coll. of Automation Engineering, Univ. of Electronic Science and Technology of China, Chengdu 610054, ChinaColl. of Automation Engineering, Univ. of Electronic Science and Technology of China, Chengdu 610054, China
Long, Bing
Huang, Jian-Guo
论文数: 0引用数: 0
h-index: 0
机构:
Coll. of Automation Engineering, Univ. of Electronic Science and Technology of China, Chengdu 610054, ChinaColl. of Automation Engineering, Univ. of Electronic Science and Technology of China, Chengdu 610054, China
Huang, Jian-Guo
Wang, Hou-Jun
论文数: 0引用数: 0
h-index: 0
机构:
Coll. of Automation Engineering, Univ. of Electronic Science and Technology of China, Chengdu 610054, ChinaColl. of Automation Engineering, Univ. of Electronic Science and Technology of China, Chengdu 610054, China
Wang, Hou-Jun
Xi Tong Gong Cheng Yu Dian Zi Ji Shu/Systems Engineering and Electronics,
2009,
31
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