Limitations of photoluminescence based external quantum efficiency measurements

被引：0
|
作者：
Paduthol, Appu [1 ]
Juhl, Mattias Klaus [1 ]
Trupke, Thorsten [1 ]
机构：
[1] Univ New South Wales, Sydney, NSW, Australia
来源：
2018 IEEE 7TH WORLD CONFERENCE ON PHOTOVOLTAIC ENERGY CONVERSION (WCPEC) (A JOINT CONFERENCE OF 45TH IEEE PVSC, 28TH PVSEC & 34TH EU PVSEC) | 2018年
关键词：
External quantum efficiency; Spectral response of photoluminescence; SPECTRAL RESPONSE; SOLAR;
D O I：
暂无
中图分类号：
X [环境科学、安全科学];
学科分类号：
08 ; 0830 ;
摘要：
The spectral response of photoluminescence is a contactless method that provides a measurement of the relative external quantum efficiency of silicon solar cells and wafers. This paper elaborates on a few limitations of this measurement technique to measure the actual external quantum efficiency. Firstly, this method is accurate only if the measured luminescence originates from the radiative recombination of voltage dependent carriers. This paper investigates the impact of luminescence from other spurious sources of luminescence, such as from dielectric layers, on the measurement. Secondly, the paper investigates the impact of angle of incidence of the excitation source on the measurement. This is relevant for LED based light sources, which typically have a high emission angle.
引用
收藏
页码：2224 / 2228
页数：5
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