Near-field optical virtual probe: A potential method for near-field storage

被引：0
|
作者：
Hong, T [1 ]
Wang, J [1 ]
Sun, LQ [1 ]
Li, DC [1 ]
机构：
[1] Tsing Hua Univ, State Key Lab Precis Measurement Technol & Instru, Dept Precis Instruments, Beijing 100084, Peoples R China
来源：
ISOM/ODS 2002: INTERNATIONAL SYMPOSIUM ON OPTICAL MEMORY AND OPTICAL DATA STORAGE TOPICAL MEETING, TECHNICAL DIGEST | 2002年
关键词：
D O I：
暂无
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
引用
收藏
页码：302 / 304
页数：3
相关论文
共 50 条
  • [31] Interferometric probe for near-field optical microscopy systems
    Yu. N. Kul’chin
    O. B. Vitrik
    A. V. Bezverbnyi
    A. V. Dyshlyuk
    A. A. Kuchmizhak
    Technical Physics Letters, 2010, 36 : 599 - 601
  • [32] Near-field scanning optical microscope probe analysis
    Klapetek, Petr
    Bursik, Jiri
    Valtr, Miroslav
    Martinek, Jan
    ULTRAMICROSCOPY, 2008, 108 (07) : 671 - 676
  • [33] Method of scanning near-field optical lithography
    Dryakhlushin, VF
    Vostokov, NV
    Klimov, AY
    Rogov, VV
    Shashkin, VI
    12TH INTERNATIONAL CONFERENCE - MICROWAVE & TELECOMMUNICATION TECHNOLOGY, CONFERENCE PROCEEDINGS, 2002, : 453 - 454
  • [34] Method of resonance near-field optical microscopy
    Kadochkin A.S.
    J. Appl. Spectrosc., 2007, 4 (552-560): : 552 - 560
  • [35] Near-field optical microscopy
    M. Labardi
    P. G. Gucciardi
    M. Allegrini
    La Rivista del Nuovo Cimento, 2000, 23 (4) : 1 - 35
  • [36] Simulation of near-field optical manipulator using the combination of a near-field scanning optical microscope probe and an atomic force microscope metallic probe
    Liu, Binghui
    Yang, Lijun
    Wang, Yang
    JOURNAL OF APPLIED PHYSICS, 2011, 109 (10)
  • [37] Near-field optical microscopy
    Labardi, M
    Gucciardi, PG
    Allegrini, M
    RIVISTA DEL NUOVO CIMENTO, 2000, 23 (04): : 1 - 35
  • [38] THE NEAR-FIELD OPTICAL MICROSCOPE
    VIGOUREUX, JM
    COURJON, D
    RECHERCHE, 1990, 21 (223): : 959 - 961
  • [39] Near-field optical holography
    Bozhevolnyi, SI
    Vohnsen, B
    PHYSICAL REVIEW LETTERS, 1996, 77 (16) : 3351 - 3354
  • [40] NEAR-FIELD OPTICAL IMAGING
    ISAACSON, M
    JOURNAL OF METALS, 1988, 40 (07): : A10 - A10
12345