NEW INSIGHTS INTO THE EVALUATION OF ELECTROSTATIC MOLECULAR PROPERTIES FROM X-RAY DIFFRACTION DATA

被引：0
|
作者：
Abramov, A. [1 ]
机构：
[1] SUNY Buffalo, Dept Chem, Buffalo, NY 14260 USA
来源：
ACTA CRYSTALLOGRAPHICA A-FOUNDATION AND ADVANCES | 1999年 / 55卷
关键词：
D O I：
暂无
中图分类号：
O6 [化学];
学科分类号：
0703 ;
摘要：
M06.OC.002
引用
收藏
页码：37 / 38
页数：2
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