NEW INSIGHTS INTO THE EVALUATION OF ELECTROSTATIC MOLECULAR PROPERTIES FROM X-RAY DIFFRACTION DATA

被引：0

作者：

Abramov, A. ^{[1
]}

机构：

[1] SUNY Buffalo, Dept Chem, Buffalo, NY 14260 USA

来源：

ACTA CRYSTALLOGRAPHICA A-FOUNDATION AND ADVANCES | 1999年 / 55卷

关键词：

D O I：

暂无

中图分类号：

O6 [化学];

学科分类号：

0703 ;

摘要：

M06.OC.002

引用

页码：37 / 38

页数：2

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