Mode locking phenomena of the current-induced skyrmion-lattice motion in microfabricated MnSi

被引:7
|
作者
Sato, Takuro [1 ]
Kikkawa, Akiko [1 ]
Taguchi, Yasujiro [1 ]
Tokura, Yoshinori [1 ,2 ,3 ]
Kagawa, Fumitaka [1 ,2 ]
机构
[1] RIKEN, Ctr Emergent Matter Sci CEMS, Wako, Saitama 3510198, Japan
[2] Univ Tokyo, Dept Appl Phys, Tokyo 1138656, Japan
[3] Univ Tokyo, Tokyo Coll, Tokyo 1138656, Japan
关键词
Microfabrication;
D O I
10.1103/PhysRevB.102.180411
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
Using voltage fluctuation spectroscopy, we observe the mode locking phenomena of current-induced skyrmion-lattice motion in microfabricated MnSi. When only a dc electric current is applied, the frequency of the emergent narrow-band noise (NBN) monotonously increases with increasing dc current. By contrast, if an ac electric current is further added, the NBN frequency becomes much less dependent on the dc current when it satisfies a simple integer ratio to the ac current frequency, a hallmark of mode locking. In the mode locked state, the linewidth of the NBN is sharpened, indicating the enhanced coherence of the skyrmion-lattice motion. The overall features of the mode locking phenomena are qualitatively reproduced within the framework of the classical rigid-sphere model.
引用
收藏
页数:5
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