Influence of impurities and intrinsic defects on physicomechanical properties of silicon carbide single crystals

被引:1
|
作者
Garshin, A
Lavrenova, E
Vodakov, Y
Mokhov, E
机构
关键词
D O I
10.1016/S0272-8842(96)00047-8
中图分类号
TQ174 [陶瓷工业]; TB3 [工程材料学];
学科分类号
0805 ; 080502 ;
摘要
Microindentation with a Vickers diamond pyramid was used in a study of mechanical properties of 6H-SiC with different concentrations of impurities (nitrogen and aluminium) and of intrinsic defects generated by irradiation or during growth under nonstoichiometric conditions. It was found that SiC crystals containing nonstoichiometric and radiation defects, as :yell as samples with high nitrogen concentration (C-N similar or equal to 10(20) cm(-3)), have a greater tendency for cracking, which results in deterioration of the microstrength characteristics. An analysis of the results obtained leads to the conclusion that the observed changes are primarily caused by intrinsic defect clusters rather than dislocations. (C) 1997 Elsevier Science Limited and Techna S.r.l.
引用
收藏
页码:409 / 411
页数:3
相关论文
共 50 条
  • [1] Influence of impurities and intrinsic defects on physicomechanical properties of silicon carbide single crystals
    Garshin, AP
    Lavrenova, EA
    Vodacov, YA
    Mokhov, EN
    SILICON CARBIDE AND RELATED MATERIALS 1995, 1996, 142 : 413 - 416
  • [2] EFFECT OF IMPURITIES AND INHERENT DEFECTS ON THE PHYSICOMECHANICAL PROPERTIES OF SILICON-CARBIDE SINGLE-CRYSTALS
    GARSHIN, AP
    LAVRENOVA, EA
    VODAKOV, YA
    MOKHOV, EN
    FIZIKA TVERDOGO TELA, 1992, 34 (09): : 2748 - 2752
  • [3] The influence of impurities and planar defects on the infrared properties of silicon carbide films
    Rajasekhara, S.
    Neuner, B. H., III
    Zorman, C. A.
    Jegenyes, N.
    Ferro, G.
    Shvets, G.
    Ferreira, P. J.
    Kovar, D.
    APPLIED PHYSICS LETTERS, 2011, 98 (19)
  • [4] Interaction of intrinsic defects with impurities in Al doped ZnSe single crystals
    Ivanova, G. N.
    Nedeoglo, D. D.
    Negeoglo, N. D.
    Sirkeli, V. P.
    Tiginyanu, I. M.
    Ursaki, V. V.
    JOURNAL OF APPLIED PHYSICS, 2007, 101 (06)
  • [5] Intrinsic defects in silicon carbide polytypes
    Son, N.T.
    Hai, P.N.
    Janzén, E.
    Materials Science Forum, 2001, 353-356 : 499 - 504
  • [6] Intrinsic defects in silicon carbide polytypes
    Son, NT
    Hai, PN
    Janzén, E
    SILICON CARBIDE AND RELATED MATERIALS, ECSCRM2000, 2001, 353-356 : 499 - 504
  • [7] Intrinsic defects in cubic silicon carbide
    Itoh, H
    Kawasuso, A
    Ohshima, T
    Yoshikawa, M
    Nashiyama, I
    Tanigawa, S
    Misawa, S
    Okumura, H
    Yoshida, S
    PHYSICA STATUS SOLIDI A-APPLIED RESEARCH, 1997, 162 (01): : 173 - 198
  • [8] Microstructural Evolution of Silica on Single Crystal Silicon Carbide. Part II: Influence of Impurities and Defects
    Presser, Volker
    Loges, Anselm
    Wirth, Richard
    Nickel, Klaus G.
    JOURNAL OF THE AMERICAN CERAMIC SOCIETY, 2009, 92 (08) : 1796 - 1805
  • [9] Gaseous etching for characterization of structural defects in silicon carbide single crystals
    Powell, J.A.
    Larkin, D.J.
    Trunek, A.J.
    Materials Science Forum, 1998, 264-268 (pt 1): : 421 - 424
  • [10] Gaseous etching for characterization of structural defects in silicon carbide single crystals
    Powell, JA
    Larkin, DJ
    Trunek, AJ
    SILICON CARBIDE, III-NITRIDES AND RELATED MATERIALS, PTS 1 AND 2, 1998, 264-2 : 421 - 424