Triplet grain growth in a-texture polycrystalline ZnO thin films

被引:1
|
作者
Aebersold, A. Brian [1 ]
Hebert, Cecile [1 ,2 ]
Alexander, Duncan T. L. [1 ,2 ]
机构
[1] Ecole Polytech Fed Lausanne EPFL, Interdisciplinary Ctr Electron Microscopy CIME, Lausanne, Switzerland
[2] Ecole Polytech Fed Lausanne EPFL, Inst Phys IPHYS, Electron Spectrometry & Microscopy Lab LSME, Lausanne, Switzerland
关键词
Polycrystalline thin films; ZnO; Grain triplet; Renucleation; Twinning; BLENDE-WURTZITE POLYTYPISM; TEM; ORIENTATION; EBSD;
D O I
10.1016/j.actamat.2020.08.068
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
A growth of grain triplets is identified in vapor deposited, a-texture polycrystalline zinc oxide thin films, using a combination of transmission electron microscopy-based automated crystal orientation mapping and high-resolution imaging. Each triplet consists of three wurtzite phase grains, coordinated to near tetrahedral relative growth angles by the close-packed planes of a few nanometer diameter core of metastable zinc blende phase ZnO located at their triple junction. The triplets are aligned such that two of the grains have their fast growing [2 (1) over bar (1) over bar 0] axes (near-) parallel to the substrate normal, and so coarsen under the principle of competitive grain growth. In contrast, growth of the third grain with a (1 0 (1) over bar 3) texture is impeded, such that it forms a small wedge between the ends of its two larger neighbors. Remarkably, all three boundaries between the grains adhere to a [2 (1) over bar (1) over bar 0]/ (0 1 (1) over bar 3) coherent twin orientation relationship, which corresponds to a grain geometry that is incommensurate with a perfect crystallographic nature. This coherency is primarily achieved via the small grain having an orientation that rotates internally by 10+2 degrees across its volume, when going between the two interfaces formed with the neighboring large grains. The energy associated with this structural distortion is compensated by the formation of the coherent twin boundaries, such that the triplets are a stable or semi-stable growth form that are abundant in the film. The small (1 0 (1) over bar 3) texture grains may renucleate persistently, taking either of two possible orientations from the underlying tetrahedral coordination. By developing a phenomenological model for the triplet geometry and form, we associate these two orientations to small hexagonal caps and angled wedges seen in the surface morphology of the film. These findings potentially carry relevance for a wide range of vapor deposited compact films and free-standing nanostructures of wurtzite phase octet binary semiconductor compounds. We therefore believe that these insights can stimulate new research, for instance to obtain a more fundamental understanding of the growth mechanisms at the atomistic level. (C) 2020 Acta Materialia Inc. Published by Elsevier Ltd.
引用
收藏
页码:523 / 529
页数:7
相关论文
共 50 条
  • [41] Elastic property estimation in polycrystalline films with crystallographic texture and grain shape
    Hendrix, BC
    Yu, LG
    Xu, KW
    He, JW
    POLYCRYSTALLINE THIN FILMS: STRUCTURE, TEXTURE, PROPERTIES, AND APPLICATIONS II, 1996, 403 : 171 - 176
  • [42] Role of underlayers in the development of evolutionary texture in polycrystalline thin films
    Adamik, M
    Barna, PB
    SURFACE & COATINGS TECHNOLOGY, 1996, 80 (1-2): : 109 - 112
  • [43] Role of underlayers in the development of evolutionary texture in polycrystalline thin films
    Research Inst for Technical Physics, Budapest, Hungary
    Surf Coat Technol, 1-2 (109-112):
  • [44] TEXTURE OF OBLIQUELY SPUTTERED ZNO THIN-FILMS
    CERVEN, I
    LACKO, T
    NOVOTNY, I
    TVAROZEK, V
    HARVANKA, M
    JOURNAL OF CRYSTAL GROWTH, 1993, 131 (3-4) : 546 - 550
  • [45] On the solid-state dewetting of polycrystalline thin films: Capillary versus grain growth approach
    Jacquet, P.
    Podor, R.
    Ravaux, J.
    Lautru, J.
    Teisseire, J.
    Gozhyk, I.
    Jupille, J.
    Lazzari, R.
    ACTA MATERIALIA, 2018, 143 : 281 - 290
  • [46] Effects of grain growth on dynamic surface scaling during the deposition of Al polycrystalline thin films
    Lita, AE
    Sanchez, JE
    PHYSICAL REVIEW B, 2000, 61 (11): : 7692 - 7699
  • [47] Theoretical analysis of abnormal grain growth in HCP-polycrystalline thin films on rigid substrates
    Zhang, JM
    Xu, KW
    PROGRESS IN CRYSTAL GROWTH AND CHARACTERIZATION OF MATERIALS, 2000, 40 (1-4) : 315 - 321
  • [48] Studies on effect of oxygen flow rate in textured grain growth of ZnO thin films
    Thomas, Deepu
    Vattappalam, Sunil C.
    Mathew, Sunny
    Augustine, Simon
    INTERNATIONAL CONFERENCE ON MATERIALS SCIENCE AND TECHNOLOGY (ICMST 2012), 2015, 73
  • [49] Effect of Defects on the Grain and Grain Boundary Strength in Polycrystalline Copper Thin Films
    Suzuki, Ken
    Yiqing, Fan
    Luo, Yifan
    Miura, Hideo
    2018 INTERNATIONAL CONFERENCE ON SIMULATION OF SEMICONDUCTOR PROCESSES AND DEVICES (SISPAD 2018), 2018, : 88 - 91
  • [50] GROWTH OF POLYCRYSTALLINE SILICON FILMS - GRAIN-SIZE
    EMMANUEL, A
    POLLOCK, HM
    JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 1973, 120 (11) : 1586 - 1591