Multibeam Fizeau interferometer pattern localization

被引：1
|
作者：
Zakharov, Y [1 ]
机构：
[1] Univ Nizhni Novgorod, Dept Radiophys, Nizhnii Novgorod 603600, Russia
来源：
FOURTH INTERNATIONAL CONFERENCE ON CORRELATION OPTICS | 1999年 / 3904卷
关键词：
multibeam interference; laser interferometry;
D O I：
10.1117/12.370411
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
Fizeau interferometer pattern analysis have carried out in the case of arbitrary slope beam illumination. Analysis gel localization plane location and its dependence on wedge relative index of refraction and on the interferometer entrance mirror slope angle to the incidence wave. The analyses fits experiment.
引用
收藏
页码：268 / 269
页数：2
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