Complex Permittivity Measurement for Thin Dielectric Rods with High Permittivity Using a 50 GHz Band TM010 Mode Cavity

被引：2

作者：

Shimizu, Takashi ^{[1
]}

Hayashi, Takuya ^{[1
]}

Kogami, Yoshinori ^{[1
]}

机构：

[1] Utsunomiya Univ, Utsunomiya, Tochigi, Japan

来源：

2021 IEEE ASIA-PACIFIC MICROWAVE CONFERENCE (APMC) | 2021年

关键词：

cavity resonators; complex permittivity; dielectric rod; millimeter wave measurement;

D O I：

10.1109/APMC52720.2021.9661810

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

Realization of a sustainable smart society requires the rapid development of various millimeter wave devices. Applying an FDM type 3D printer is one of a solution for fast and low-cost microwave and millimeter wave circuit manufacturing. However, complex permittivity of 3D printer materials has not been enough reported. We have been proposed an accurate measurement method for a thin dielectric rod with a low permittivity using a 50 GHz band TM010 mode cavity. In this paper, we propose a millimeter wave measurement method for low loss dielectric thin rods with a high dielectric constant using the 50 GHz band TM010 mode cavity with a small insertion hole. Two types of 3D printer filament with high permittivity are used as thin rod samples. As a result, the proposed method is revealed complex permittivity for the filament rod and can be useful to measure a thin dielectric rod with a high permittivity at a 50 GHz band.

引用

页码：464 / 466

页数：3

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