Complex Permittivity Measurement for Thin Dielectric Rods with High Permittivity Using a 50 GHz Band TM010 Mode Cavity

被引:2
|
作者
Shimizu, Takashi [1 ]
Hayashi, Takuya [1 ]
Kogami, Yoshinori [1 ]
机构
[1] Utsunomiya Univ, Utsunomiya, Tochigi, Japan
关键词
cavity resonators; complex permittivity; dielectric rod; millimeter wave measurement;
D O I
10.1109/APMC52720.2021.9661810
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
Realization of a sustainable smart society requires the rapid development of various millimeter wave devices. Applying an FDM type 3D printer is one of a solution for fast and low-cost microwave and millimeter wave circuit manufacturing. However, complex permittivity of 3D printer materials has not been enough reported. We have been proposed an accurate measurement method for a thin dielectric rod with a low permittivity using a 50 GHz band TM010 mode cavity. In this paper, we propose a millimeter wave measurement method for low loss dielectric thin rods with a high dielectric constant using the 50 GHz band TM010 mode cavity with a small insertion hole. Two types of 3D printer filament with high permittivity are used as thin rod samples. As a result, the proposed method is revealed complex permittivity for the filament rod and can be useful to measure a thin dielectric rod with a high permittivity at a 50 GHz band.
引用
收藏
页码:464 / 466
页数:3
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