Electronic structure, Fermi surface and x-ray magnetic circular dichroism in the CeAgSb2

被引:1
|
作者
Antonov, V. N. [1 ]
机构
[1] NAS Ukraine, GV Kurdyumov Inst Met Phys, 36 Vernadsky Str, UA-03142 Kiev, Ukraine
关键词
y Fermi surface; magnetic circular dichroism; electronic structure; SUM-RULES; STATE; APPROXIMATION; SYSTEMS;
D O I
10.1063/1.5116534
中图分类号
O59 [应用物理学];
学科分类号
摘要
The electronic structure, Fermi surface, angle dependence of the cyclotron masses and extremal cross sections of the Fermi surface as well as x-ray magnetic circular dichroism (XMCD) in the CeAgSb2 compound were investigated from first principles using the fully relativistic Dirac linear muffin-tin orbital method. In our calculations Ce 4f states have been considered as: 1) itinerant using the generalized gradient approximation (GGA), 2) fully localized, treating them as core states, and 3) partly localized using the GGA + U approximation. The effect of the spin-orbit (SO) interaction and Coulomb repulsion U in a frame of the GGA + U method on the Fermi surface, orbital dependence of the cyclotron masses, and extremal cross sections of the Fermi surface are examined in details. We show that the conventional GGA band calculations fail to describe the Fermi surface of the CeAgSb2 due to wrong position of Ce 4f states (too close to the E-F). On the other hand, fully localized (4f states in core) and the GGA + U approach produce similar Fermi surfaces and dHvA frequencies in the CeAgSb2. A good agreement with the experimental data of XMCD spectra at the Ce M-4.5 edges was achieved using the GGA + U approximation. The origin of the XMCD spectra in the compound is examined. The core hole effect in the final states has been investigated using a supercell approximation. It improves the agreement be-tween the theory and the experiment of the XAS and the XMCD spectra at the Ce M-4.5 edges. Published under license by AIP Publishing.
引用
收藏
页码:870 / 879
页数:10
相关论文
共 50 条
  • [31] Electronic structure and x-ray magnetic circular dichroism in YbAgCu4 and YbInCu4
    Antonov, V. N.
    Bekenov, L. V.
    Antropov, V. P.
    PHYSICAL REVIEW B, 2014, 89 (16):
  • [32] Electronic structure and X-ray magnetic circular dichroism in the Ni-Mn-Ga Heusler alloys
    Antonov, V. N.
    Bekenov, L. V.
    Uba, S.
    Bonda, A.
    Uba, L.
    JOURNAL OF ALLOYS AND COMPOUNDS, 2017, 695 : 1826 - 1837
  • [34] Electronic structure and x-ray magnetic circular dichroism of gadolinium beyond the local spin density approximation
    Abdelouahed, Samir
    Baadji, N.
    Alouani, M.
    PHYSICAL REVIEW B, 2007, 75 (09)
  • [35] Electronic structure and x-ray magnetic circular dichroism in A2FeReO6 (A = Ca, Sr, and Ba) oxides
    Antonov, V. N.
    Bekenov, L. V.
    Ernst, A.
    PHYSICAL REVIEW B, 2016, 94 (03)
  • [36] Electronic Structure and X-Ray Magnetic Circular Dichroism in Sm-Doped Bi2Se3
    Antonov, V. N.
    Bekenov, L. V.
    Uba, S.
    Ernst, A.
    ACTA PHYSICA POLONICA A, 2018, 133 (03) : 453 - 455
  • [37] Electronic structure and x-ray magnetic circular dichroism of Sr2FeMoO6:: Ab initio calculations
    Kanchana, V.
    Vaitheeswaran, G.
    Alouani, M.
    Delin, A.
    PHYSICAL REVIEW B, 2007, 75 (22)
  • [38] Soft X-ray magnetic circular dichroism of c(2 x 2) CuMn ordered surface alloy
    Kimura, A
    Kanbe, T
    Xie, T
    Qiao, S
    Taniguchi, M
    Muro, T
    Imada, S
    Suga, S
    JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS, 2003, 42 (7B): : 4692 - 4694
  • [39] Transmission X-ray microscopy using X-ray magnetic circular dichroism
    T. Eimüller
    P. Fischer
    M. Köhler
    M. Scholz
    P. Guttmann
    G. Denbeaux
    S. Glück
    G. Bayreuther
    G. Schmahl
    D. Attwood
    G. Schütz
    Applied Physics A, 2001, 73 : 697 - 701
  • [40] Transmission X-ray microscopy using X-ray magnetic circular dichroism
    Eimüller, T
    Fischer, P
    Köhler, M
    Scholz, M
    Guttmann, P
    Denbeaux, G
    Glück, S
    Bayreuther, G
    Schmahl, G
    Attwood, D
    Schütz, G
    APPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING, 2001, 73 (06): : 697 - 701