Modeling the Dynamic Self-Heating of PCM

被引：0
|
作者：
Marcolini, G. [1 ]
Giovanardi, F. [1 ]
Rudan, M. [1 ]
Buscemi, F. [1 ]
Piccinini, E. [1 ]
Brunetti, R. [2 ]
Cappelli, A. [2 ]
机构：
[1] Univ Bologna, E De Castro Adv Res Ctr Elect Syst ARCES, I-40136 Bologna, Italy
[2] Univ Modena, Dept Math & Comp Sci, I-41125 Modena, Italy
来源：
2013 PROCEEDINGS OF THE EUROPEAN SOLID-STATE DEVICE RESEARCH CONFERENCE (ESSDERC) | 2013年
关键词：
PHASE-CHANGE; NUCLEATION;
D O I：
暂无
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
The dynamic scheme for extracting parameters of the phase-change memories is examined. The experimentally-observed behavior due to the heating and quenching of the material is modeled by a set of differential and algebraic equations. The method allows one to extract important design parameters of the PCM, along with their temperature dependence.
引用
收藏
页码：346 / 349
页数：4
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