Effect of elastic stresses on the thermoelectric properties of Pb1-xGexTe epitaxial layers

被引：4
|
作者：
Vodop'yanov, V. N.
Bakhtinov, A. P.
Slyn'ko, E. I.
Radchenko, M. V.
Sichkovskyi, V. I.
Lashkarev, G. V.
Dobrowolski, W.
Yakiela, R.
机构：
[1] Natl Acad Sci Ukraine, Inst Problems Mat Sci, UA-03680 Kiev, Ukraine
[2] Polish Acad Sci, Inst Phys, PL-02668 Warsaw, Poland
来源：
PHYSICS OF THE SOLID STATE | 2006年 / 48卷 / 07期
关键词：
D O I：
10.1134/S1063783406070201
中图分类号：
O469 [凝聚态物理学];
学科分类号：
070205 ;
摘要：
The temperature dependence of the thermopower of Pb-1_xGexTe (x = 0.01-0.05) epitaxial films grown on BaF2(111) substrates was measured. The temperature of the ferroelectric phase transition was found to disagree with that obtained for bulk single crystals of the same composition. This disagreement was explained as resulting from the effect of elastic stresses arising in the crystal lattice of the Pb1-xGexTe compound due to the difference between the thermal expansion coefficients of the film and the substrate during cooling of the layers from the growth temperature to the temperature of measurement.
引用
收藏
页码：1342 / 1345
页数：4
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