A new methodology of rainfall retrievals from indirect measurements.

被引:0
|
作者
Falkovich, A [1 ]
Lord, S [1 ]
Treadon, R [1 ]
机构
[1] NCEP, EMC, WWB, Camp Springs, MD 20746 USA
关键词
D O I
暂无
中图分类号
P4 [大气科学(气象学)];
学科分类号
0706 ; 070601 ;
摘要
引用
收藏
页码:234 / 235
页数:2
相关论文
共 50 条
  • [31] Validation of maritime rainfall Retrievals from the TRMM microwave radiometer
    Kim, MJ
    Weinman, JA
    Houze, RA
    JOURNAL OF APPLIED METEOROLOGY, 2004, 43 (06): : 847 - 859
  • [32] On the calculation of the balance constants from gyroscopic measurements.
    Goebel, JB
    ZEITSCHRIFT FUR PHYSIKALISCHE CHEMIE--STOCHIOMETRIE UND VERWANDTSCHAFTSLEHRE, 1912, 81 (03): : 298 - 307
  • [33] SURFACE TENSION OF ALLOYS FROM MODULUS MEASUREMENTS.
    Papazian, Harold A.
    High temperature science, 1984, 18 (01): : 53 - 57
  • [34] The calculation of activity coefficients from conductivity measurements.
    Davies, CW
    PHILOSOPHICAL MAGAZINE, 1927, 4 (20): : 244 - 250
  • [35] ON THE RECOVERY OF FUNCTIONS AND THEIR DERIVATIVES FROM IMPERFECT MEASUREMENTS.
    Georgiev, Alexander A.
    IEEE Transactions on Systems, Man and Cybernetics, 1984, SMC-14 (06): : 900 - 903
  • [36] Optimisation of electronic nose measurements. Part I: Methodology of output feature selection
    Roussel, S
    Forsberg, G
    Steinmetz, V
    Grenier, P
    Bellon-Maurel, V
    JOURNAL OF FOOD ENGINEERING, 1998, 37 (02) : 207 - 222
  • [37] New uses of dielectric analyses for technical and analytical measurements.
    Ebert, L
    ANGEWANDTE CHEMIE, 1934, 47 : 0305 - 0315
  • [38] The potential of iron calculated from equilibria measurements.
    Lamb, AB
    JOURNAL OF THE AMERICAN CHEMICAL SOCIETY, 1910, 32 : 1214 - 1220
  • [39] Presentation of new fundamental concepts and units in photometric measurements.
    Klopsteg, PE
    JOURNAL OF THE OPTICAL SOCIETY OF AMERICA AND REVIEW OF SCIENTIFIC INSTRUMENTS, 1924, 9 (06): : 674 - 674
  • [40] New JEDEC standards for thermal measurements.: Review and examples
    Motta, V
    THERMAL MANAGEMENT OF ELECTRONIC SYSTEMS II, 1997, : 293 - 300