Two-photon microscopy using hollow Gaussian beam

被引：0
|
作者：
Ul Alam, Sabir [1 ]
Soni, Niraj Kumar [1 ]
Ren, Yu-Xuan [1 ]
He, Hongsen [1 ]
Tsia, Kevin K. [1 ]
Wong, Kenneth K. Y. [1 ]
机构：
[1] Univ Hong Kong, Dept Elect & Elect Engn, Pokfulam Rd, Hong Kong, Peoples R China
来源：
2020 CONFERENCE ON LASERS AND ELECTRO-OPTICS (CLEO) | 2020年
基金：
中国国家自然科学基金;
关键词：
D O I：
暂无
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
We demonstrate two-photon microscopy based on hollow Gaussian beam illumination by leveraging an axially elongated central lobe, along with reduced central lobe width for increased mode order of the focused hollow Gaussian beam. (C) 2020 The Author(s)
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页数：2
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