Probing nano-scale viscoelastic response in air and in liquid with dynamic atomic force microscopy

被引:7
|
作者
Crippa, Federica [1 ]
Thoren, Per-Anders [2 ]
Forchheimer, Daniel [2 ]
Borgani, Riccardo [2 ]
Rothen-Rutishauser, Barbara [1 ]
Petri-Fink, Alke [1 ,3 ]
Haviland, David B. [2 ]
机构
[1] Univ Fribourg, Adolphe Merkle Inst, BioNanomat Grp, Chemin Verdiers 4, CH-1700 Fribourg, Switzerland
[2] KTH Royal Inst Technol, Nanostruct Phys, SE-10791 Stockholm, Sweden
[3] Univ Fribourg, Dept Chem, Chemin Musee 8, CH-1700 Fribourg, Switzerland
基金
瑞士国家科学基金会;
关键词
ELASTIC PROPERTIES; STIFFNESS; SURFACES; FLUIDS;
D O I
10.1039/c8sm00149a
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
摘要
We perform a comparative study of dynamic force measurements using an Atomic Force Microscope (AFM) on the same soft polymer blend samples in both air and liquid environments. Our quantitative analysis starts with calibration of the same cantilever in both environments. Intermodulation AFM (ImAFM) is used to measure dynamic force quadratures on the same sample. We validate the accuracy of the reconstructed dynamic force quadratures by numerical simulation of a realistic model of the cantilever in liquid. In spite of the very low quality factor of this resonance, we find excellent agreement between experiment and simulation. A recently developed moving surface model explains the measured force quadrature curves on the soft polymer, in both air and liquid.
引用
收藏
页码:3998 / 4006
页数:9
相关论文
共 50 条
  • [21] NANO-SCALE FORCES, STRESSES, AND TIP GEOMETRY EVOLUTION OF AMPLITUDE MODULATION ATOMIC FORCE MICROSCOPY PROBES
    Vahdat, Vahid
    Grierson, David S.
    Turner, Kevin T.
    Carpick, Robert W.
    PROCEEDINGS OF THE ASME INTERNATIONAL DESIGN ENGINEERING TECHNICAL CONFERENCES AND COMPUTERS AND INFORMATION IN ENGINEERING CONFERENCE, VOL 7, 2012, : 543 - 549
  • [22] Assessment of nano-scale tribological and mechanical properties of flexible transparent polymers based on atomic force microscopy
    Shin, Dong-Gap
    Kim, Tae-Hyung
    Kim, Dae-Eun
    CIRP ANNALS-MANUFACTURING TECHNOLOGY, 2019, 68 (01) : 599 - 602
  • [23] Imaging surfaces of nano-scale roughness by atomic force microscopy with carbon nanotubes as tips: a comparative study
    Munz, Martin
    Kim, Jae-Ho
    Krause, Oliver
    Roy, Debdulal
    SURFACE AND INTERFACE ANALYSIS, 2011, 43 (11) : 1382 - 1391
  • [24] Micro- and Nano-scale Measurement of the Thermophysical Properties of Polymeric Materials Using Atomic Force Microscopy
    Dawson, Angela
    Rides, Martin
    Cuenat, Alexandre
    Winkless, Laurie
    INTERNATIONAL JOURNAL OF THERMOPHYSICS, 2013, 34 (05) : 865 - 882
  • [25] Investigation of nano-scale scratch and stick-slip behaviors of polycarbonate using atomic force microscopy
    Liu, Jie
    Jiang, Han
    Cheng, Qian
    Wang, Chaoming
    TRIBOLOGY INTERNATIONAL, 2018, 125 : 59 - 65
  • [26] Nano-scale imaging of chromosomes and DNA by scanning near-field optical/atomic force microscopy
    Yoshino, T
    Sugiyama, S
    Hagiwara, S
    Fukushi, D
    Shichiri, M
    Nakao, H
    Kim, JM
    Hirose, T
    Muramatsu, H
    Ohtani, T
    ULTRAMICROSCOPY, 2003, 97 (1-4) : 81 - 87
  • [27] Micro- and Nano-scale Measurement of the Thermophysical Properties of Polymeric Materials Using Atomic Force Microscopy
    Angela Dawson
    Martin Rides
    Alexandre Cuenat
    Laurie Winkless
    International Journal of Thermophysics, 2013, 34 : 865 - 882
  • [28] Dynamic characterization of nano oscillators by atomic force microscopy
    Ilic, B.
    Krylov, S.
    Bellan, L. M.
    Craighead, H. G.
    PROCEEDINGS OF THE IEEE TWENTIETH ANNUAL INTERNATIONAL CONFERENCE ON MICRO ELECTRO MECHANICAL SYSTEMS, VOLS 1 AND 2, 2007, : 286 - +
  • [29] Nano-scale Cu metal patterning by using an atomic force microscope
    Tomita, Y
    Hasegawa, Y
    Kobayashi, K
    APPLIED SURFACE SCIENCE, 2005, 244 (1-4) : 107 - 110
  • [30] Nano-scale studies of the tensile properties of liquids in an atomic force microscope
    Williams, PR
    Hilal, N
    Bowen, WR
    Barrow, M
    COMPUTATIONAL METHODS AND EXPERIMENTAL MEASUREMENTS X, 2001, 3 : 105 - 116