共 50 条
- [1] A case study of IR-drop in structured At-speed testing INTERNATIONAL TEST CONFERENCE 2003, PROCEEDINGS, 2003, : 1098 - 1104
- [2] An IR-Drop Aware Test Pattern Generator for Scan-Based At-Speed Testing 2016 IEEE 25TH ASIAN TEST SYMPOSIUM (ATS), 2016, : 167 - 172
- [3] Low capture switching activity test generation for reducing IR-drop in at-speed scan testing JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS, 2008, 24 (04): : 379 - 391
- [4] Low Capture Switching Activity Test Generation for Reducing IR-Drop in At-Speed Scan Testing Journal of Electronic Testing, 2008, 24 : 379 - 391
- [5] Dynamic IR-drop Prediction of At-speed Two-vector Tests Using Machine Learning 2024 INTERNATIONAL VLSI SYMPOSIUM ON TECHNOLOGY, SYSTEMS AND APPLICATIONS, VLSI TSA, 2024,
- [6] Critical-path-aware X-filling for effective IR-drop reduction in at-speed scan testing 2007 44TH ACM/IEEE DESIGN AUTOMATION CONFERENCE, VOLS 1 AND 2, 2007, : 527 - +
- [7] Effect of IR-Drop on path delay testing using statistical analysis PROCEEDINGS OF THE 16TH ASIAN TEST SYMPOSIUM, 2007, : 245 - +
- [8] Distribution-Controlled X-Identification for Effective Reduction of Launch-Induced IR-Drop in At-Speed Scan Testing IEICE TRANSACTIONS ON INFORMATION AND SYSTEMS, 2011, E94D (06): : 1216 - 1226
- [9] A Physical-Location-Aware X-filling Method for IR-Drop Reduction in At-Speed Scan Test DATE: 2009 DESIGN, AUTOMATION & TEST IN EUROPE CONFERENCE & EXHIBITION, VOLS 1-3, 2009, : 1234 - 1237