Determination of optical constants of thin films from transmittance trace

被引：54
|
作者：
Bhattacharyya, S. R. [1 ]
Gayen, R. N. [1 ]
Paul, R. [1 ]
Pal, A. K. [1 ]
机构：
[1] Jadavpur Univ, Dept Instrumentat Sci, Kolkata 700032, W Bengal, India
来源：
THIN SOLID FILMS | 2009年 / 517卷 / 18期
关键词：
Optical constants; Transmittance; AMORPHOUS-SILICON; REFRACTIVE-INDEX; ALLOY-FILMS; ZNO FILMS; SUBSTRATE; THICKNESS; GROWTH; SEMICONDUCTORS; BANDGAP; GAP;
D O I：
10.1016/j.tsf.2009.03.168
中图分类号：
T [工业技术];
学科分类号：
08 ;
摘要：
A simple method is depicted in this communication to determine the optical constants of transparent thin films from transmittance versus wavelength traces, showing no fringes, for evaluating thickness. The strength of this technique is apparent when applied to Zn1-xMgxO films. (C) 2009 Elsevier B.V. All rights reserved.
引用
收藏
页码：5530 / 5536
页数：7
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