Surface Cu depletion of Cu(In,Ga)Se2 films: An investigation by hard X-ray photoelectron spectroscopy

被引：63
|
作者：
Moenig, H. [1 ,2 ]
Fischer, Ch. -H. [1 ,2 ]
Caballero, R. [2 ]
Kaufmann, C. A. [2 ]
Allsop, N. [2 ]
Gorgoi, M. [2 ]
Klenk, R. [2 ]
Schock, H. -W. [2 ]
Lehmann, S. [2 ]
Lux-Steiner, M. C. [1 ,2 ]
Lauermann, I. [2 ]
机构：
[1] Free Univ Berlin, D-14195 Berlin, Germany
[2] Helmholtz Zentrum Berlin Mat & Energie, D-14109 Berlin, Germany
来源：
ACTA MATERIALIA | 2009年 / 57卷 / 12期
关键词：
Chalcopyrite thin films; Cu depletion; Interface defects; Hard X-ray photoelectron spectroscopy; Surface energy; SOLAR-CELL; THIN-FILMS; ANGULAR-DISTRIBUTION; CUINSE2; PARAMETERS; GROWTH; MODEL;
D O I：
10.1016/j.actamat.2009.04.029
中图分类号：
T [工业技术];
学科分类号：
08 ;
摘要：
The origin Of surface Cu depletion Of polycrystalline chalcopyrite thin films and its consequences for the physics of related solar cells have been discussed for the past 15 years. In order to shed light on the composition and thickness of this Cu-depleted surface layer, depth-dependent compositional analysis by hard X-ray photoelectron spectroscopy was performed. The data from Cu-poor grown Cu(Tn,Ga)Se-2 samples point to a Surface layer in the sub-nanometer regime, which is completely depleted Of Cu. This result supports the Surface reconstruction model proposed by first-principles calculations by other authors. Analysis of the surface morphology of the investigated samples confirms the conjunction of Cu depletion and faceting of the surface. Theoretical considerations show that the apparent Surface concentration ratio of (Cu/[In] + [Ga]) = 1/3 found by conventional photoelectron spectroscopy Studies can be explained by the surface reconstruction model. (C) 2009 Acta Materialia Inc. Published by Elscvier Ltd. All rights reserved.
引用
收藏
页码：3645 / 3651
页数：7
相关论文
共 50 条
  • [31] X-ray vision of Cu(In,Ga)Se2: from the Ga/In ratio to solar-cell performance
    Ossig, C.
    Pyrlik, N.
    Carron, R.
    Fevola, G.
    Patjens, S.
    Strelow, C.
    Flugge, J.
    Kolditz, A.
    Siebels, J.
    Garrevoet, J.
    Spiers, K.
    Seyrich, M.
    Bruckner, D.
    Hagemann, J.
    Seiboth, F.
    Schropp, A.
    Falkenberg, G.
    Mews, A.
    Schroer, C. G.
    Kipp, T.
    Stuckelberger, M. E.
    JOURNAL OF PHYSICS-ENERGY, 2022, 4 (04):
  • [32] Surface characterization of chemically treated Cu(In, Ga)Se2 thin films
    Matsushita Electric Ind. Co, Ltd, Kyoto, Japan
    Jpn J Appl Phys Part 1 Regul Pap Short Note Rev Pap, 9 A (4760-4764):
  • [33] Investigation of the chemical state of copper in Cu/SiO2 composite films by x-ray photoelectron spectroscopy
    S. A. Gurevich
    T. A. Zaraiskaya
    S. G. Konnikov
    V. M. Mikushkin
    S. Yu. Nikonov
    A. A. Sitnikova
    S. E. Sysoev
    V. V. Khorenko
    V. V. Shnitov
    Yu. S. Gordeev
    Physics of the Solid State, 1997, 39 : 1691 - 1695
  • [34] Investigation of the chemical state of copper in Cu/SiO2 composite films by x-ray photoelectron spectroscopy
    Gurevich, SA
    Zaraiskaya, TA
    Konnikov, SG
    Mikushkin, VM
    Nikonov, SY
    Sitnikova, AA
    Sysoev, SE
    Khorenko, VV
    Shnitov, VV
    Gordeev, YS
    PHYSICS OF THE SOLID STATE, 1997, 39 (10) : 1691 - 1695
  • [35] X-ray diffraction spectroscopy and X-ray photoelectron spectroscopy studies of Cu-doped ZnO films
    Xue, H.
    Chen, Y.
    Xu, X. L.
    Zhang, G. H.
    Zhang, H.
    Ma, S. Y.
    PHYSICA E-LOW-DIMENSIONAL SYSTEMS & NANOSTRUCTURES, 2009, 41 (05): : 788 - 791
  • [36] The Comparison of (Ag,Cu)(In,Ga)Se2 and Cu(In,Ga)Se2 Thin Films Deposited by Three-Stage Coevaporation
    Chen, Lei
    Lee, JinWoo
    Shafarman, William N.
    IEEE JOURNAL OF PHOTOVOLTAICS, 2014, 4 (01): : 447 - 451
  • [37] Compositional intermixing at CdS/Cu(In,Ga)Se2 rough interface studied by x-ray fluorescence
    Kim, S
    Soo, YL
    Kioseoglou, G
    Kao, YH
    Ramanathan, K
    Deb, SK
    JOURNAL OF APPLIED PHYSICS, 2002, 91 (10) : 6416 - 6422
  • [38] Recrystallization of Cu(In,Ga)Se2 thin films studied by X-ray diffraction (vol 61, pg 4347, 2013)
    Rodriguez-Alvarez, H.
    Barreau, N.
    Kaufmann, C. A.
    Weber, A.
    Klaus, M.
    Painchaud, T.
    Schock, H. -W.
    Mainz, R.
    ACTA MATERIALIA, 2014, 79 : 436 - 436
  • [39] Characterization of Cu(In,Ga)Se2 thin films and solar cells by photoacoustic spectroscopy
    Atarashi, Akiko
    Yagi, Masakazu
    Shirakata, Sho
    JAPANESE JOURNAL OF APPLIED PHYSICS, 2014, 53 (05)
  • [40] Forward scattering in hard X-ray photoelectron spectroscopy: Structural investigation of buried Mn-Ga films
    ViolBarbosa, Carlos E.
    Ouardi, Siham
    Kubota, Takahide
    Mizukami, Shigemi
    Fecher, Gehard H.
    Miyazaki, Terunobu
    Ikenaga, Eiji
    Felser, Claudia
    APPLIED PHYSICS LETTERS, 2015, 106 (05)
12345