Photo-Stability Measurement of Electro-Optic Polymer Waveguides With High Intensity at 1550-nm Wavelength

被引：16

作者：

Takahashi, Satsuki ^{[1
]}

Bhola, Bipin ^{[1
]}

Yick, Andrew ^{[1
]}

Steier, William H. ^{[1
]}

Luo, Jingdong ^{[2
]}

Jen, Alex K. -Y. ^{[2
]}

Jin, Dan ^{[3
]}

Dinu, Raluca ^{[3
]}

机构：

[1] Univ So Calif, Los Angeles, CA 90089 USA

[2] Univ Washington, Seattle, WA 98105 USA

[3] Lumera Inc, Bothell, WA 98011 USA

来源：

JOURNAL OF LIGHTWAVE TECHNOLOGY | 2009年 / 27卷 / 5-8期

关键词：

Optical polymers; optical waveguides; photo-degradation; photo-stability; CHROMOPHORE DESIGN; MODULATORS; DEVICES;

D O I：

10.1109/JLT.2008.2011500

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

Photo-stability measurements of electro-optic polymer inverted ridge waveguides, fabricated from AJ-CKL1, AJ416 and LPD-80, are conducted up to 30, 100, and 100 mW of input power coupled into the waveguides respectively. These experiments are performed in a N(2) atmosphere to exclude absorbed O(2). AJ416 and LPD-80 are found to be stable up to at least 1 MW/cm(2) a 1550 nm. In contrast, photo-degradation was observed in an ambient atmosphere with 1 mW (LPD-80) and 10 mW (AJ-CKL1) coupled into the waveguides.

引用

页码：1045 / 1050

页数：6

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