Recent developments in industrial applications of elastic scatter X-ray inspection

被引：28
|
作者：
Luggar, RD [1 ]
Gilboy, WB [1 ]
机构：
[1] Univ Surrey, Dept Phys, Sch Phys Sci, Guildford GU2 5XH, Surrey, England
来源：
RADIATION PHYSICS AND CHEMISTRY | 1999年 / 56卷 / 1-2期
关键词：
X-ray; elastic scatter; diffraction; non-invasive inspection;
D O I：
10.1016/S0969-806X(99)00278-9
中图分类号：
O64 [物理化学（理论化学）、化学物理学];
学科分类号：
070304 ; 081704 ;
摘要：
This article describes some recent advances in elastic X-ray scatter as a means of non-invasive industrial inspection. Elastic scatter leads directly to X-ray diffraction and is dependent upon the molecular structure of the scattering medium, This makes the technique particularly sensitive to discrimination between low-Z materials and has been exploited in such areas as the detection of "soft", or low-Z, contaminants in foodstuff, for the discrimination of oil and water and in the detection of mineral deposits. These applications are discussed together with an outline of X-ray scattering theory and an overview of the various means of exploiting elastic X-ray scatter for materials inspection and imaging. (C) 1999 Elsevier Science Ltd. All rights reserved.
引用
收藏
页码：213 / 227
页数：15
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