Characterization of multilayers of thin films by measurement of X-ray specular reflectivity

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作者：
Durand, O
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VIDE-SCIENCE TECHNIQUE ET APPLICATIONS | 2002年 / 57卷 / 304期
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TB3 [工程材料学];
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0805 ; 080502 ;
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页码：387 / 429
页数：43
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