Peculiarities of the thickness dependence of the superconducting properties of thin Nb films

被引:13
|
作者
Ilin, KS
Vitusevich, SA [1 ]
Jin, BB
Gubin, AI
Klein, N
Siegel, M
机构
[1] Forschungszentrum Julich GmbH, Inst Schichten & Grenzflachen, D-52425 Julich, Germany
[2] NAS Ukraine, Usikov Inst Radiophys & Elect, UA-61085 Kharkov, Ukraine
[3] Univ Karlsruhe, Inst Mikro & Nanoelektrotech Syst, D-76187 Karlsruhe, Germany
关键词
Nb thin films; penetration depth; mean free path;
D O I
10.1016/j.physc.2004.03.118
中图分类号
O59 [应用物理学];
学科分类号
摘要
In this report we present results of a systematical study of relevant properties of superconducting Nb thin films of thickness from 8 to 200 nm deposited on Si. We have found that a reduction of thickness d below 50 nm leads to a significant decrease of the critical temperature T-C and a strong increasing of the residual resistivity in normal state rho(0) and a strong increase of the Ginzburg-Landau magnetic penetration depth lambda(GL)(0). Taking into account the dependencies of T-C and rho(0) on the thickness of the film, we have obtained good agreement between experimental dependencies of lambda(GL)(0) on d and theoretical estimations in dirty limit for films thinner than 100 nm. (C) 2004 Elsevier B.V. All rights reserved.
引用
收藏
页码:700 / 702
页数:3
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