Bulk Linearization Techniques

被引：0

作者：

Arnaud, Alfredo ^{[1
]}

Puyol, Rafael ^{[1
]}

Hardy, Denisse ^{[1
]}

Miguez, Matias ^{[1
]}

Gak, Joel ^{[1
]}

机构：

[1] Univ Catolica Uruguay, Elect Engn Dept, Ave 8 Octubre 2738, Montevideo 11600, Uruguay

来源：

2019 IEEE INTERNATIONAL SYMPOSIUM ON CIRCUITS AND SYSTEMS (ISCAS) | 2019年

关键词：

linearization; bulk-degeneration; CMOS transistor; LINEAR-RANGE; DESIGN;

D O I：

暂无

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

The use of the bulk terminal to enhance the linear properties of the MOS transistor is examined. Firstly, bulk-linearization of a MOS differential pair is presented, including harmonic distortion measurements. Then bulk-degeneration technique is extended to the triode region to implement large MOS pseudo-resistors. A new asymmetric bulk-modified composite MOS with an equivalent saturation voltage of several hundred mV is introduced, and a 150M Omega pseudo-resistor by stacking a few of these stages is presented. Finally, bulk-linearization of the MOS differential pair and the MOS resistor are combined to implement a 6.4nS transconductor with above 1V linear range, consuming only 6nA, improving the compromise between linear range and power consumption of previously reported small transconductance OTAs.

引用

页数：5

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