In-situ ellipsometric study of the growth of Au thin films

被引：0
|
作者：
Shibuya, T [1 ]
Amano, N [1 ]
Kawabata, S [1 ]
Yokota, H [1 ]
机构：
[1] TOKAI UNIV,FAC ENGN,DEPT ELECTRO PHOTO OPT,HIRATSUKA,KANAGAWA 25912,JAPAN
来源：
INTERNATIONAL SYMPOSIUM ON POLARIZATION ANALYSIS AND APPLICATIONS TO DEVICE TECHNOLOGY | 1996年 / 2873卷
关键词：
D O I：
暂无
中图分类号：
TH7 [仪器、仪表];
学科分类号：
0804 ; 080401 ; 081102 ;
摘要：
引用
收藏
页码：168 / 171
页数：4
相关论文
共 50 条
  • [1] In-situ ellipsometric study of calcium phosphate biomineralisation on organic thin films
    Shahlori, Rayomand
    Waterhouse, Geoffrey I. N.
    Nelson, Andrew R. J.
    McGillivray, Duncan J.
    INTERNATIONAL JOURNAL OF NANOTECHNOLOGY, 2017, 14 (1-6) : 375 - 384
  • [2] Spin Reorientation in Thin Au/Co/Au Films: in-situ XMCD and EXAFS Study
    Holub-Krappe, Elisabeth
    Andersson, C.
    Konishi, T.
    Karis, O.
    Maletta, H. -J.
    Arvanitis, D.
    ACTA CRYSTALLOGRAPHICA A-FOUNDATION AND ADVANCES, 2005, 61 : C416 - C416
  • [3] GROWTH OF THIN AG2S FILMS ON SILVER LAYERS - IN-SITU ELLIPSOMETRIC AND CONDUCTIVITY STUDIES
    RUSSEV, S
    VASSILEV, L
    VULCHEV, V
    LUTOV, L
    ARGIROV, T
    JOURNAL OF PHYSICS-CONDENSED MATTER, 1994, 6 (31) : 6237 - 6244
  • [4] In-situ ellipsometric characterization of the electrodeposition of metal films
    Hilfiker, JN
    Thompson, DW
    Hale, JS
    Woollam, JA
    THIN SOLID FILMS, 1995, 270 (1-2) : 73 - 77
  • [5] Advances in multichannel ellipsometric techniques for in-situ and real-time characterization of thin films
    Collins, RW
    An, I
    Chen, C
    Ferlauto, AS
    Zapien, JA
    THIN SOLID FILMS, 2004, 469 (SPEC. ISS.) : 38 - 46
  • [6] IN-SITU ELLIPSOMETRIC MONITORING OF THE GROWTH OF POLYCRYSTALLINE SILICON THIN-FILMS BY RF PLASMA CHEMICAL-VAPOR-DEPOSITION
    TACHIBANA, K
    SHIRAFUJI, T
    HAYASHI, Y
    MAEKAWA, S
    MORITA, T
    JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS, 1994, 33 (7B): : 4191 - 4194
  • [7] ELLIPSOMETRIC STUDY OF THE GROWTH OF THIN ORGANIC POLYMER-FILMS
    HAMNETT, A
    HILLMAN, AR
    BERICHTE DER BUNSEN-GESELLSCHAFT-PHYSICAL CHEMISTRY CHEMICAL PHYSICS, 1987, 91 (04): : 329 - 336
  • [8] In-situ ellipsometric investigation of TiO2 thin-film initial growth
    Lee, S
    Park, BH
    Oh, SG
    JOURNAL OF THE KOREAN PHYSICAL SOCIETY, 1997, 31 (02) : 352 - 356
  • [9] An instrument for in-situ stress measurement in thin films during growth
    Fitz, C
    Fukarek, W
    Kolitsch, A
    Möller, W
    SURFACE & COATINGS TECHNOLOGY, 2000, 128 : 474 - 478
  • [10] In-situ electrochemical STM study of platinum thin films
    Xu, Qingmin
    Kreidler, Eric
    Wipf, David O.
    He, Ting
    ABSTRACTS OF PAPERS OF THE AMERICAN CHEMICAL SOCIETY, 2007, 233 : 227 - 227
12345