Formation of transition metal silicides by high energy ion beam mixing in Mn/Si and Ni/Si single and multilayer samples

被引:15
|
作者
Chaudhuri, S
Biswas, S
Gupta, A
Avasthi, DK
Bhattacharyya, D
Teichert, S
Sarkar, DK
机构
[1] Kalyani Univ, Dept Phys, Kalyani 741235, W Bengal, India
[2] IUC, DAEF, Indore 452001, India
[3] Ctr Nucl Sci, New Delhi 110067, India
[4] Tech Univ, Inst Phys, D-09107 Chemnitz, Germany
来源
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS | 2004年 / 217卷 / 04期
关键词
silicides;
D O I
10.1016/j.nimb.2003.12.020
中图分类号
TH7 [仪器、仪表];
学科分类号
0804 ; 080401 ; 081102 ;
摘要
Metal silicides are produced by high energy heavy ion (120 MeV Au9+, fluence-1 x 10(13) ions/cm(2)) irradiation in transition metal/silicon (Mn/Si single layer and Ni/Si single and multilayer) samples. X-ray reflectivity (XRR) studies are carried out on both the virgin and irradiated samples to find out the presence of silicides at the interfaces between the metal and the silicon layers. The formation of crystalline metal silicides is confirmed and phases identified by grazing incidence X-ray diffraction (GIXRD) studies. The enhancement of intermixing and silicide formation as a result of irradiation is established in both the Mn/Si and Ni/Si samples. The results are analyzed and interpreted following the thermal spike model where the interaction between the high energy ion and the lattice is determined by processes like electron-phonon and phonon-phonon couplings. (C) 2003 Elsevier B.V. All rights reserved.
引用
收藏
页码:589 / 597
页数:9
相关论文
共 50 条
  • [21] The application of ITTFA and ARXPS to study the ion beam mixing of metal/Si bilayers
    Palacio, C.
    Arranz, A.
    SURFACE AND INTERFACE ANALYSIS, 2008, 40 (3-4) : 676 - 682
  • [22] AN ION-BEAM MIXING MODEL FOR COMPOUND FORMATION - THE CASE OF PD/SI
    DESIMONI, J
    TRAVERSE, A
    NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 1993, 80-1 (80-81): : 91 - 93
  • [23] THE EFFECT OF BOUNDARY-CONDITIONS IN ION MIXING OF MULTILAYERED NI-SI SAMPLES
    HEWETT, CA
    LAU, SS
    SUNI, I
    POKER, DB
    NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 1985, 7-8 (MAR): : 597 - 600
  • [24] ION-BEAM MIXING AND OXIDATION OF A SI/GE-MULTILAYER UNDER OXYGEN BOMBARDMENT
    DECOSTER, W
    BRIJS, B
    OSICEANU, P
    ALAY, J
    CAYMAX, M
    VANDERVORST, W
    NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 1994, 85 (1-4): : 911 - 915
  • [25] Study of ion beam induced mixing in nano-layered Si/C multilayer structures
    Prakash, R
    Amirthapandian, S
    Phase, DM
    Deshpande, SK
    Kesavamoorthy, R
    Nair, KGM
    NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 2006, 244 (01): : 283 - 288
  • [26] Formation of hexagonal silicon carbide by high energy ion beam irradiation on Si(100) substrate
    Bhuyan, H.
    Favre, M.
    Valderrama, E.
    Avaria, G.
    Chuaqui, H.
    Mitchell, I.
    Wyndham, E.
    Saavedra, R.
    Paulraj, M.
    JOURNAL OF PHYSICS D-APPLIED PHYSICS, 2007, 40 (01) : 127 - 131
  • [27] ION-BEAM MIXING OF FE30NI70-SI MULTILAYER THIN-FILMS - AN FMR AND A STRUCTURAL STUDY
    RIVOIRE, M
    SURAN, G
    GERARD, P
    BRUNEL, M
    JOURNAL DE PHYSIQUE, 1988, 49 (C-8): : 1715 - 1716
  • [28] Synthesis and structure of ternary transition-metal silicides Zr3Mn4Si6 and Hf3Mn4Si6
    Tkachuk, AV
    Crerar, SJ
    Mar, A
    JOURNAL OF SOLID STATE CHEMISTRY, 2004, 177 (11) : 3939 - 3943
  • [29] Low energy ion beam modification of Cu/Ni/Si(100) surface
    Parida, S. K.
    Medicherla, V. R. R.
    Mishra, D. K.
    Choudhary, S.
    Solanki, V.
    Varma, Shikha
    BULLETIN OF MATERIALS SCIENCE, 2014, 37 (07) : 1569 - 1573
  • [30] Low energy ion beam modification of Cu/Ni/Si(100) surface
    S K PARIDA
    V R R MEDICHERLA
    D K MISHRA
    S CHOUDHARY
    V SOLANKI
    SHIKHA VARMA
    Bulletin of Materials Science, 2014, 37 : 1569 - 1573