Thermocouples with Built-In Self-testing

被引:22
|
作者
Jun, Su [1 ]
Kochan, Orest [2 ]
Kochan, Roman [2 ]
机构
[1] Hubei Univ Technol, Sch Comp Sci, Wuhan, Peoples R China
[2] Lviv Natl Polytech Univ, Bandera Str 12, UA-79013 Lvov, Ukraine
基金
中国国家自然科学基金;
关键词
Built-in self-testing; Self-testing; Thermocouple; Thermocouple inhomogeneity; Thermocouple drift model; INHOMOGENEITY;
D O I
10.1007/s10765-016-2044-2
中图分类号
O414.1 [热力学];
学科分类号
摘要
The aim of this paper is to create a method of built-in self-testing of thermocouples in situ. This aim is achieved by using the equivalent operating time of the thermocouple. The method does not require replacement of thermocouples from their operating place as it could be done during the operation of the thermocouples. The only necessary condition, that makes self-testing possible, is a constant measuring junction temperature during the procedure of self-testing. The determined equivalent operating time allows finding the place of a given thermocouple in the thermocouple's drift model as well as in the model of thermoelectric inhomogeneity.
引用
收藏
页码:1 / 9
页数:9
相关论文
共 50 条
  • [31] Hierarchical built-in self-testing and FPGA based healing methodology for system-on-a-chip
    Venishetti, Sandeep K.
    Akoglu, Ali
    Kalra, Rahul
    NASA/ESA CONFERENCE ON ADAPTIVE HARDWARE AND SYSTEMS, PROCEEDINGS, 2007, : 717 - +
  • [32] Programmable built-in self-testing of embedded RAM clusters in system-on-chip architectures
    Benso, A
    Di Carlo, S
    Di Natale, G
    Prinetto, P
    Bodoni, ML
    IEEE COMMUNICATIONS MAGAZINE, 2003, 41 (09) : 90 - 97
  • [33] Built-In Oscillation-Based Self-Testing of a 2.4 GHz LNA in 0.35μm CMOS
    Nel, Hendrik P.
    Stander, Tinus
    Dualibe, Fortunato C.
    2018 25TH IEEE INTERNATIONAL CONFERENCE ON ELECTRONICS, CIRCUITS AND SYSTEMS (ICECS), 2018, : 837 - 840
  • [34] Online Test Vector Insertion: A Concurrent Built-In Self-Testing (CBIST) Approach for Asynchronous Logic
    Maier, Juergen
    Steininger, Andreas
    PROCEEDINGS OF THE 2014 IEEE 17TH INTERNATIONAL SYMPOSIUM ON DESIGN AND DIAGNOSTICS OF ELECTRONIC CIRCUITS & SYSTEMS (DDECS), 2014, : 33 - 38
  • [35] BUILT-IN SELF TESTING OF EMBEDDED MEMORIES
    JAIN, SK
    STROUD, CE
    IEEE DESIGN & TEST OF COMPUTERS, 1986, 3 (05): : 27 - 37
  • [36] On a new graph theory approach to designing zero-aliasing space compressors for built-in self-testing
    Das, Sunil R.
    Hossain, Altaf
    Biswas, Satyendra
    Petriu, Emil M.
    Assaf, Mansour H.
    Jone, Wen-Ben
    Sahinoglu, Mehmet
    IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, 2008, 57 (10) : 2146 - 2168
  • [37] An Efficient Routing Method for Pseudo-Exhaustive Built-in Self-Testing of High-Speed Interconnects
    Liu, J.
    Jone, W. B.
    2007 IEEE INTERNATIONAL CONFERENCE ON COMPUTER DESIGN, VOLS, 1 AND 2, 2007, : 360 - 367
  • [38] Pseudo-exhaustive built-in self-testing of signal integrity for high-speed SoC interconnects
    Liu, J.
    Jone, W. B.
    Das, S. R.
    2007 IEEE INSTRUMENTATION & MEASUREMENT TECHNOLOGY CONFERENCE, VOLS 1-5, 2007, : 1134 - +
  • [39] A Built-In Self-Testing Framework for Asynchronous Bundled-Data NoC Switches Resilient to Delay Variations
    Miorandi, Gabriele
    Celin, Alberto
    Favalli, Michele
    Bertozzi, Davide
    2016 TENTH IEEE/ACM INTERNATIONAL SYMPOSIUM ON NETWORKS-ON-CHIP (NOCS), 2016,
  • [40] Concurrent built-in self-testing under the constraint of shared test resources and its test time reduction
    Goh, S. H.
    Chan, Y. H.
    Lin, Zhao
    Lam, Jeffrey
    INTEGRATION-THE VLSI JOURNAL, 2017, 59 : 198 - 205