Effects of Molding Compound Cure on Warpage of Electronic Packages

被引:5
|
作者
de Vreugd, J. [1 ]
Jansen, K. M. B. [1 ]
Ernst, L. J. [1 ]
Bohm, C. [2 ]
Kessler, A. [2 ]
Preu, H. [2 ]
机构
[1] Delft Univ Technol, Mekelweg 2, NL-2628 CD Delft, Netherlands
[2] Infincon Technol AG, D-81726 Munich, Germany
关键词
D O I
10.1109/EPTC.2008.4763511
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
Warpage is a critical issue for all electronic package molding process. Much work is done in the past to predict the warpage of a package after the cooling down from the molding process. However, there are many material models for the molding Compound to predict warpage: Elastic and viscoelastic models arc used, and there arc even groups Which use cure-dependent viscoelastic models [1]. In this paper, we compare results obtained with the different models with each other. In our group we investigated the mechanical properties of a molding compound in detail. From this research it is concluded that the viscoelastic properties highly depend on the chemical conversion level. Furthermore, dilatometric studies showed that the bulk modulus and the coefficient of thermal expansion are independent oil time. The thus obtained model Which includes cure shrinkage is implemented in the finite element software ABAQUS by making use of user-subroutines (UMAT). The model is used in a theoretical study on the warpage of a double layered beam consisting out of a layer of molding compound and a layer of copper. This beam is cooled clown form a temperature below T-g to room temperature with different cooling rates. warpage of the beam is calculated with different models and a comparison is made. It turned out that there is a big difference between the different approaches.
引用
收藏
页码:675 / +
页数:3
相关论文
共 50 条
  • [21] Modeling of Cure Kinetics of Molding Compound and Its Effects on Drag Force in Compression Molding
    Chung, Chia-Heng
    Cheng, Hsien-Chie
    Chen, Wen-Hwa
    2018 INTERNATIONAL CONFERENCE ON ELECTRONICS PACKAGING AND IMAPS ALL ASIA CONFERENCE (ICEP-IAAC), 2018, : 262 - 265
  • [22] Prediction and verification of process induced warpage of electronic packages
    van Driel, WD
    Zhang, GQ
    Janssen, JHJ
    Ernst, LJ
    Su, F
    Chian, KS
    Yi, S
    MICROELECTRONICS RELIABILITY, 2003, 43 (05) : 765 - 774
  • [23] The impact of moisture in mold compound preforms on the warpage of PBGA packages
    Lin, TY
    Njoman, B
    Crouthamel, D
    Chua, KH
    Teo, SY
    Ma, YY
    MICROELECTRONICS RELIABILITY, 2004, 44 (04) : 603 - 609
  • [24] The impact of moisture in mold compound preforms on the warpage of PBGA packages
    Lin, TY
    Njoman, B
    Crouthamel, D
    Chua, KH
    Teo, SY
    IEEE/CPMT/SEMI(R) 28TH INTERNATIONAL ELECTRONICS MANUFACTURING TECHNOLOGY SYMPOSIUM, 2003, : 273 - 278
  • [25] Processing and Warpage Evaluation of Package-on-Packages with Various Epoxy Molding Compounds
    Jung, Dong-Myung
    Kim, Min-Young
    Oh, Tae-Sung
    ELECTRONIC MATERIALS LETTERS, 2014, 10 (02) : 467 - 471
  • [26] Processing and warpage evaluation of Package-on-Packages with various epoxy molding compounds
    Dong-Myung Jung
    Min-Young Kim
    Tae-Sung Oh
    Electronic Materials Letters, 2014, 10 : 467 - 471
  • [27] The Effect of Epoxy Molding Compound Dispensing Uniformity on PoP Warpage
    Pan, Tao
    Wu, Lin
    Sun, Isaac
    Li, Brian
    Ren, Zhenhui
    Quan, Changhao
    Ahn, Charles
    2023 24TH INTERNATIONAL CONFERENCE ON ELECTRONIC PACKAGING TECHNOLOGY, ICEPT, 2023,
  • [28] Thermal modeling for warpage effects in organic packages
    Wei, Xiaojin
    Marston, Ken
    Sikka, Kamal
    2008 11TH IEEE INTERSOCIETY CONFERENCE ON THERMAL AND THERMOMECHANICAL PHENOMENA IN ELECTRONIC SYSTEMS, VOLS 1-3, 2008, : 310 - 314
  • [29] Cure shrinkage analysis of epoxy molding compound
    Oota, K
    Saka, M
    POLYMER ENGINEERING AND SCIENCE, 2001, 41 (08): : 1373 - 1379
  • [30] A study on the cure behavior of epoxy molding compound
    Yun, SY
    Oh, M
    Park, NJ
    POLYMER-KOREA, 2000, 24 (06) : 837 - 844