Neutron irradiation study of silicon photomultipliers from different vendors

被引:2
|
作者
Kushpil, V. [1 ]
Mikhaylov, V. [1 ,2 ]
Kugler, A. [1 ]
Kushpil, S. [1 ]
Ladygin, V. P. [3 ]
Reznikov, S. G. [3 ]
Svoboda, O. [1 ]
Tlusty, P. [1 ]
机构
[1] ASCR, Inst Nucl Phys, Rez 25068, Czech Republic
[2] Czech Tech Univ, Zikova 1903-4, Prague 16636 6, Czech Republic
[3] Joint Inst Nucl Res, Joliot Curie 6, Dubna 141980, Moscow Region, Russia
关键词
SiPM detector; Calorimeter; Si; Avalanche; Doping impurities;
D O I
10.1016/j.nima.2016.06.101
中图分类号
TH7 [仪器、仪表];
学科分类号
0804 ; 080401 ; 081102 ;
摘要
We present recent results on the investigation of the KEtEK, ZECOTEK, HAMAMATSU and SENSL SiPM properties after irradiation by the 6-35 MeV neutrons. The typical neutron fluence was about 10(12) n/cm(2). The changing of the internal structure of the irradiated SiPMs was studied by the measuring of the C-V and C-f characteristics. We have observed the strong influence of the SiPM manufacturing technology on their radiation hardness. The application of the obtained results to the development of the readout electronics is discussed. (C) 2016 Elsevier B.V. All rights reserved.
引用
收藏
页码:114 / 117
页数:4
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