AFM measurements of adhesion between nanoparticles and substrate

被引：0
|
作者：
Burtovyy, Ruslan
Liu, Yong
Zdyrko, Bogdan
Tregub, Alex
Moinpour, Mansour
Buehler, Mark
Luzinov, Igor
机构：
[1] Clemson Univ, Sch Mat Sci & Engn, Clemson, SC 29634 USA
[2] Intel Corp, CMO FMO, Santa Clara, CA 95051 USA
[3] Intel Corp, PTD, Santa Clara, CA 95051 USA
来源：
ABSTRACTS OF PAPERS OF THE AMERICAN CHEMICAL SOCIETY | 2006年 / 231卷
关键词：
D O I：
暂无
中图分类号：
O6 [化学];
学科分类号：
0703 ;
摘要：
145-COLL
引用
收藏
页数：2
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