Efficiency Enhancement of Scattering Near-Field Probes

被引：0

作者：

Siday, Tom ^{[1
]}

Mitrofanov, Oleg ^{[1
]}

机构：

[1] UCL, Elect & Elect Engn, London WC1E 7JE, England

来源：

2019 44TH INTERNATIONAL CONFERENCE ON INFRARED, MILLIMETER, AND TERAHERTZ WAVES (IRMMW-THZ) | 2019年

关键词：

D O I：

10.1109/irmmw-thz.2019.8873922

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

We measure, for the first time, the scattering efficiency of resonant terahertz (THz) probes for scattering-type THz near-field microscopy. We fabricate the probes by placing an indium 'antenna' directly on the tine of a quartz tuning fork (QTF), which we use as an atomic force microscope (AFM) probe in tapping mode. THz time-domain spectroscopy (TDS) of the THz field scattered from the probe shows that the scattering efficiency of the indium antenna exhibits resonant enhancement determined by the antenna length. These resonant scattering probes can enable THz near-field imaging applications where THz contrast is weak, such as 2D materials or biological systems.

引用

页数：2

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