Transient sensitivity computation in controlled explicit piecewise linear simulation

被引:3
|
作者
Nguyen, TV [1 ]
Devgan, A
Nastov, OJ
Winston, DW
机构
[1] IBM Corp, Austin Res Lab, Austin, TX 78717 USA
[2] IBM Corp, Server Grp, Austin, TX 78717 USA
[3] Motorola Inc, Circuit Simulat Grp, Austin, TX 78717 USA
[4] IBM Corp, Server Grp, Hopewell Junction, NY 12533 USA
关键词
D O I
10.1109/43.822623
中图分类号
TP3 [计算技术、计算机技术];
学科分类号
0812 ;
摘要
This paper presents a general method for computing transient sensitivities using both direct and adjoint methods in controlled explicit event driven simulation algorithms that employ piecewise linear device models. Sensitivity information provides first order assessment of circuit variability with respect to design variables and parasitics, This information is particularly useful for noise analysis, timing rule generation, and circuit optimization. Techniques for incorporating transient sensitivity into adaptively controlled explicit simulation, a general piecewise linear simulator, are presented. Sensitivity computation includes algorithms to handle instantaneous charge redistribution due to the discontinuous conductance models of the piecewise linear elements, and the loss of simulation accuracy due to the nonmonotonic responses in autonomous adjoint circuits with nonzero initial conditions. Results demonstrate the efficiency and accuracy of the proposed techniques.
引用
收藏
页码:98 / 110
页数:13
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