Automated and high-resolution force spectroscopy for biochemical applications

被引:0
|
作者
Jia, Haina [1 ]
Xu, Shoujun [1 ]
机构
[1] Dept Chem, Houston, TX USA
关键词
D O I
暂无
中图分类号
O6 [化学];
学科分类号
0703 ;
摘要
124
引用
收藏
页数:1
相关论文
共 50 条
  • [31] APPLICATIONS OF HIGH-RESOLUTION H-3 NMR-SPECTROSCOPY
    WILLIAMS, PG
    FUSION TECHNOLOGY, 1988, 14 (02): : 840 - 844
  • [32] Direct measurement of glycosaminoglycan intermolecular interactions via high-resolution force spectroscopy
    Seog, J
    Dean, D
    Plaas, AHK
    Wong-Palms, S
    Grodzinsky, AJ
    Ortiz, C
    MACROMOLECULES, 2002, 35 (14) : 5601 - 5615
  • [33] Applications of high-resolution electron energy loss spectroscopy to technical surfaces
    Indiana Univ, Bloomington, United States
    Langmuir, 6 (1355-1360):
  • [34] Applications of high-resolution spectroscopy: Interstellar chemistry and intermolecular interactions.
    Klemperer, W
    ABSTRACTS OF PAPERS OF THE AMERICAN CHEMICAL SOCIETY, 2001, 221 : U248 - U248
  • [35] Applications of high-resolution electron energy loss spectroscopy to technical surfaces
    Kesmodel, LL
    LANGMUIR, 1998, 14 (06) : 1355 - 1360
  • [36] High-Resolution Traction Force Microscopy
    Plotnikov, Sergey V.
    Sabass, Benedikt
    Schwarz, Ulrich S.
    Waterman, Clare M.
    QUANTITATIVE IMAGING IN CELL BIOLOGY, 2014, 123 : 367 - 394
  • [37] HIGH-RESOLUTION MAGNETIC FORCE MICROSCOPY
    GRUTTER, P
    WADAS, A
    MEYER, E
    HEINZELMANN, H
    HIDBER, HR
    GUNTHERODT, HJ
    JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS, 1990, 8 (01): : 406 - 410
  • [38] HIGH-RESOLUTION MAGNETIC FORCE MICROSCOPY
    GRUTTER, P
    WADAS, A
    MEYER, E
    HEINZELMANN, H
    HIDBER, HR
    GUNTHERODT, HJ
    JOURNAL OF APPLIED PHYSICS, 1990, 67 (09) : 5953 - 5953
  • [39] Diffusion coefficient measurement by high resolution NMR spectroscopy: Biochemical and pharmaceutical applications
    Lindon, JC
    Liu, ML
    Nicholson, JK
    REVIEWS IN ANALYTICAL CHEMISTRY, 1999, 18 (1-2): : 23 - 66
  • [40] Microcantilever-Based Force Tracking With Applications to High-Resolution Imaging and Nanomanipulation
    Saeidpourazar, Reza
    Jalili, Nader
    IEEE TRANSACTIONS ON INDUSTRIAL ELECTRONICS, 2008, 55 (11) : 3935 - 3943