Tin diselenide van der Waals materials as new candidates for mid-infrared waveguide chips

被引:5
|
作者
Xue, Mengfei [1 ,2 ,3 ]
Zheng, Qi [1 ,2 ,3 ]
Chen, Runkun [1 ,2 ,3 ]
Bao, Lihong [1 ,2 ,3 ,4 ]
Du, Shixuan [1 ,2 ,3 ,4 ]
Chen, Jianing [1 ,2 ,3 ,4 ]
机构
[1] Chinese Acad Sci, Inst Phys, POB 603, Beijing 100190, Peoples R China
[2] Beijing Natl Lab Condensed Matter Phys, POB 603, Beijing 100190, Peoples R China
[3] Univ Chinese Acad Sci, Sch Phys Sci, Beijing 100049, Peoples R China
[4] Songshan Lake Mat Lab, Dongguan 523808, Peoples R China
基金
中国国家自然科学基金;
关键词
SPECTROSCOPY; SILICON;
D O I
10.1039/c9nr04264d
中图分类号
O6 [化学];
学科分类号
0703 ;
摘要
Mid-infrared is a spectral region of molecular vibration and rotation modes and thus, it has been widely used in chem/bio analysis. On-chip MIR waveguides combining attenuated total reflection spectroscopy provide an efficient way to minimize equipment size and benefit chemical trace analysis. But, inevitable surface roughness-induced scattering is harmful for waveguide mode propagation in traditional sensors. Two-dimensional materials are natural thin slabs with atomic-scale smooth surfaces and thus could be excellent for building weak surface scattering waveguides. Here, we used near-field microscopy to investigate a waveguide mode of 1T tin diselenide slabs at nanoscale resolution in 5.13-6.57 mu m and manipulate the mode strengths and wavelengths by controlling the slab thickness. This work extends two-dimensional materials as building blocks for integrated MIR chips.
引用
收藏
页码:14113 / 14117
页数:5
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