Discrimination between coupling and anisotropy fields in exchange-biased bilayers

被引:12
|
作者
Geshev, J. [1 ]
Nicolodi, S. [1 ]
da Silva, R. B. [2 ]
Nogues, J. [3 ,4 ]
Skumryev, V. [3 ,5 ]
机构
[1] Univ Fed Rio Grande do Sul, Inst Fis, BR-91501970 Porto Alegre, RS, Brazil
[2] Univ Fed Pampa, Ctr Ciencias Exatas & Tecnol, BR-96570000 Cacapava Do Sul, RS, Brazil
[3] ICREA, Barcelona 08010, Spain
[4] Ctr Invest Nanociencia & Nanotecnol ICN CSIC, Barcelona 08193, Spain
[5] Univ Autonoma Barcelona, Dept Fis, E-08193 Barcelona, Spain
关键词
antiferromagnetic materials; cobalt; coercive force; enhanced magnetoresistance; ferromagnetic materials; iron alloys; magnetic anisotropy; magnetic domain walls; magnetic hysteresis; magnetic susceptibility; magnetic thin films; manganese alloys; THICKNESS DEPENDENCE; CO/COO; FILMS; MAGNETORESISTANCE; COERCIVITY; SYSTEMS; MODEL;
D O I
10.1063/1.3079795
中图分类号
O59 [应用物理学];
学科分类号
摘要
In the framework of models that assume planar domain wall formed at the antiferromagnetic part of the interface of exchange-biased bilayers, one cannot distinguish between the cases of high or low ratios between the coupling and the antiferromagnet's anisotropy fields by using hysteresis loop measurement, ferromagnetic resonance, anisotropic magnetoresistance, or ac susceptibility techniques applied on one and the same sample. The analysis of the experimental data obtained on a series of FeMn/Co films indicated that once the biasing is established the variation in the coercivity with the FeMn layer thickness could be essential for solving this problem. If the coercivity decreases with the thickness then the interlayer exchange coupling is the parameter that varies while the domain-wall energy of the antiferromagnet remains practically constant.
引用
收藏
页数:6
相关论文
共 50 条
  • [41] Grain-size effects in exchange-biased FeMn/NiFe bilayers
    Manzoor, S
    Vopsaroiu, M
    Vallejo-Fernandez, G
    O'Grady, K
    JOURNAL OF APPLIED PHYSICS, 2005, 97 (10)
  • [42] Angular dependence and interfacial roughness in exchange-biased ferromagnetic/antiferromagnetic bilayers
    Kim, JV
    Stamps, RL
    McGrath, BV
    Camley, RE
    PHYSICAL REVIEW B, 2000, 61 (13): : 8888 - 8894
  • [43] Temperature effect in polycrystalline exchange-biased bilayers: A Monte Carlo study
    Maitre, A.
    Ledue, D.
    Barbe, F.
    Patte, R.
    JOURNAL OF APPLIED PHYSICS, 2012, 111 (07)
  • [44] Structure and magnetic properties of exchange-biased polycrystalline Fe/MnPd bilayers
    Tang, YJ
    Roos, BFP
    Mewes, T
    Frank, AR
    Rickart, M
    Bauer, M
    Demokritov, SO
    Hillebrands, B
    Zhou, X
    Liang, BQ
    Chen, X
    Zhan, WS
    PHYSICAL REVIEW B, 2000, 62 (13) : 8654 - 8657
  • [45] Rotation of exchange anisotropy in biased Co/CoO bilayers
    Gredig, T
    Krivorotov, IN
    Merton, C
    Goldman, AM
    Dahlberg, ED
    JOURNAL OF APPLIED PHYSICS, 2000, 87 (09) : 6418 - 6420
  • [46] Study of Magnetization Reversal by Minor Loops in IrMn/CoFe Exchange-Biased Bilayers
    Wang, L.
    Wang, S. G.
    Qin, Q. H.
    Han, X. F.
    JOURNAL OF NANOSCIENCE AND NANOTECHNOLOGY, 2012, 12 (02) : 1044 - 1048
  • [47] The structural characterisation of molecular beam epitaxy-grown exchange-biased bilayers
    Choi, YS
    Petford-Long, AK
    Ward, RCC
    Wells, MR
    THIN SOLID FILMS, 2002, 413 (1-2) : 41 - 45
  • [48] Mapping motion of antiferromagnetic interfacial uncompensated magnetic moment in exchange-biased bilayers
    X. Zhou
    L. Ma
    Z. Shi
    W. J. Fan
    R. F. L. Evans
    Jian-Guo Zheng
    R. W. Chantrell
    S. Mangin
    H. W. Zhang
    S. M. Zhou
    Scientific Reports, 5
  • [49] Phase diagrams and energy barriers of exchange-biased bilayers with additional anisotropies in the ferromagnet
    Mewes, T
    Nembach, H
    Fassbender, J
    Hillebrands, B
    Kim, JV
    Stamps, RL
    PHYSICAL REVIEW B, 2003, 67 (10)
  • [50] Exchange anisotropy and thermal stability of Mn-Ir-Pt exchange-biased layers
    Ro, Jae-Chul
    Kim, Young Keun
    Yoon, Seong-Yong
    Park, Joon-Hyuk
    Jeon, Dong-Min
    Suh, Su-Jeong
    IEEE Transactions on Magnetics, 2000, 36 (5 I) : 2569 - 2571