Hole and Electron Doping in Bi1-xCaxMnO3 (0≤x≤1) Investigated by Neutron and Synchrotron X-Ray Diffraction

被引：0
|
作者：
Garcia-Munoz, J. L. [1 ]
Aranda, M. A. G. [2 ]
LLobet, A. [1 ,3 ]
Frontera, C. [1 ]
Alonso, J. A. [4 ]
Ritter, C. [5 ]
机构：
[1] CSIC, Inst Ciencia Mat Barcelona, Barcelona, Spain
[2] Univ Malaga, Dept Quim Inorgan Cristalog & Mineral, Malaga, Spain
[3] CNRS, Lab Louis Neel, Grenoble, France
[4] CSIC, Inst Ciencia Mat Madrid, Madrid, Spain
[5] Inst Laue Langevin, Grenoble, France
来源：
ACTA CRYSTALLOGRAPHICA A-FOUNDATION AND ADVANCES | 2000年 / 56卷
关键词：
instrumentation; neutron diffraction;
D O I：
10.1107/S0108767300022194
中图分类号：
O6 [化学];
学科分类号：
0703 ;
摘要：
s7'.m1.o5
引用
收藏
页码：S69 / S69
页数：1
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